scholarly journals Measurement of Force Curve due to Electrostatic Charge on a Single Particle using Atomic Force Microscope [Translated]†

2008 ◽  
Vol 26 (0) ◽  
pp. 238-245 ◽  
Author(s):  
Tatsushi Matsuyama ◽  
Masa-aki Ohtsuka ◽  
Hideo Yamamoto
Keyword(s):  
Atomic Force Microscope ◽  
Single Particle ◽  
Electrostatic Charge ◽  
Force Curve ◽  
Atomic Force

Shape of the cantilever deflection for the atomic force microscope in force curve measurements

1994 ◽  
Vol 65 (6) ◽  
pp. 1930-1934 ◽  
Author(s):  
Minoru Sasaki ◽  
Kazuhiro Hane ◽  
Shigeru Okuma ◽  
Yoshinori Bessho
Keyword(s):  
Atomic Force Microscope ◽  
Force Curve ◽  
Cantilever Deflection ◽  
Atomic Force

Transfer of a Single Particle between Two Surfaces with an Atomic Force Microscope

1996 ◽  
Vol 100 (20) ◽  
pp. 8369-8372 ◽  
Author(s):  
Kazushige Yamamoto ◽  
Chiaki Tanuma ◽  
Nobuhiro Gemma
Keyword(s):  
Atomic Force Microscope ◽  
Single Particle ◽  
Atomic Force

A Novel Method to Reconstruct the Force Curve by Higher Harmonics of the First Two Flexural Modes in Frequency Modulation Atomic Force Microscope (FM-AFM)

2018 ◽  
Vol 24 (3) ◽  
pp. 256-263 ◽  
Author(s):  
Suoxin Zhang ◽  
Jianqiang Qian ◽  
Yingzi Li ◽  
Yingxu Zhang ◽  
Zhenyu Wang
Keyword(s):  
Atomic Force Microscope ◽  
Frequency Modulation ◽  
Materials Science ◽  
Chemical Properties ◽  
Force Curve ◽  
Higher Harmonics ◽  
Atomic Force ◽  
Novel Method ◽  
Full Force ◽  
Physical And Chemical

AbstractAtomic force microscope (AFM) is an idealized tool to measure the physical and chemical properties of the sample surfaces by reconstructing the force curve, which is of great significance to materials science, biology, and medicine science. Frequency modulation atomic force microscope (FM-AFM) collects the frequency shift as feedback thus having high force sensitivity and it accomplishes a true noncontact mode, which means great potential in biological sample detection field. However, it is a challenge to establish the relationship between the cantilever properties observed in practice and the tip–sample interaction theoretically. Moreover, there is no existing method to reconstruct the force curve in FM-AFM combining the higher harmonics and the higher flexural modes. This paper proposes a novel method that a full force curve can be reconstructed by any order higher harmonics of the first two flexural modes under any vibration amplitude in FM-AFM. Moreover, in the small amplitude regime, short range forces are reconstructed more accurately by higher harmonics analysis compared with fundamental harmonics using the Sader–Jarvis formula.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

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