A linear time-of-flight mass analyzer for thermal ionization cavity mass spectrometry

2001 ◽  
Vol 56 (7) ◽  
pp. 1175-1194 ◽  
Author(s):  
David M. Wayne ◽  
Wei Hang ◽  
Diane K. McDaniel ◽  
Robert E. Fields ◽  
Eddie Rios ◽  
...  
Separations ◽  
2020 ◽  
Vol 7 (1) ◽  
pp. 3 ◽  
Author(s):  
Benigno José Sieira ◽  
Inmaculada Carpinteiro ◽  
Rosario Rodil ◽  
José Benito Quintana ◽  
Rafael Cela

An analytical method based on high-resolution quadrupole–time-of-flight (QToF) mass spectrometry has been developed as an alternative to the classical method, using a low-resolution ion trap (IT) analyzer to reduce interferences in N-nitrosamines determination. Extraction of the targeted compounds was performed by solid-phase extraction (SPE) following the United States Environmental Protection Agency (USEPA) -521 method. First, both electron impact (EI) and positive chemical ionization (PCI) using methane as ionization gas were compared, along with IT and QToF detection. Then, parameters such as limits of detection (LOD) and quantification (LOQ), linearity, and repeatability were assessed. The results showed that the QToF mass analyzer combined with PCI was the best system for the determination of the N-nitrosamines, with instrumental LOD and LOQ in the ranges of 0.2–4 and 0.6–11 ng mL−1, respectively, which translated into method LOD and LOQ in the ranges of 0.2–1.3 and 0.6–3.9 ng L−1, respectively. The analysis of real samples showed the presence of 6 of the N-nitrosamines in influent, effluent, and tap water. N-nitrosodimethylamine (NDMA) was quantified in all the analyzed samples at concentrations between 1 and 27 ng L−1. Moreover, four additional nitrosamines were found in tap and wastewater samples.


Author(s):  
M. P. Mawn ◽  
R. W. Linton ◽  
A. Benninghoven

When coupled to a time-of-flight (TOF) mass analyzer which provides a high transmission, quasi-simultaneous detection of secondary ions, and theoretically unlimited mass range, secondary ion mass spectrometry (SIMS) is well suited for submonolayer molecular analysis of solid surfaces. Additionally, molecular ion images may be obtained by using a focused primary ion beam rastered on the sample surface to provide lateral distributions of chemical species.TOF-SIMS has been shown effective at characterizing low level polymer additives such as UV absorbers, thermal stabilizers, anti-oxidants, and slip agents in polymer extracts deposited on roughened Ag substrates. Additionally, in-situ analysis of linear low density polyethylene (LLDPE) samples using TOF-SIMS has provided information on surface segregation and surface oxidation. The polymer extract analysis has the advantage of both preconcentrating the polymer additives, as well as providing enhanced ion yields through Ag canonization. However, the in-situ analysis is also a valuable approach since it alleviates the time consuming extraction procedure and provides information on additive surface segregation and oxidation.


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