Structural characterization of ZnO films grown on SiO2 by the RF magnetron sputtering

2003 ◽  
Vol 334 (3-4) ◽  
pp. 343-346 ◽  
Author(s):  
Kwang Sik Kim ◽  
Hyoun Woo Kim ◽  
Nam Ho Kim
2002 ◽  
Vol 09 (05n06) ◽  
pp. 1757-1760
Author(s):  
L. NAVARRETE ◽  
A. MARIÑO ◽  
H. SÁNCHEZ

Ultrathin films of (Bi–Pb)–Sr–Ca–Cu–O (2223) were produced by ex situ RF magnetron sputtering on MgO (100) substrates. Films with different thermal treatments and thickness varying between 30 nm and 300 nm were obtained and studied systematically. A structural characterization of these samples was carried out and correlated with their electrical properties and thickness.


2004 ◽  
Vol 43 (5B) ◽  
pp. 3004-3007 ◽  
Author(s):  
Takahiko Yanagitani ◽  
Shin-ichi Tomohiro ◽  
Takuya Nohara ◽  
Mami Matsukawa ◽  
Yoshiaki Watanabe ◽  
...  

2011 ◽  
Vol 9 (6) ◽  
pp. 2150-2153 ◽  
Author(s):  
H. Mahdhi ◽  
Z. Ben Ayadi ◽  
L. El Mir ◽  
K. Djessas ◽  
S. Alaya

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