Electron energy-loss and X-ray photoemission spectroscopy of Sr2CuO2Cl2

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

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Using in situ electron energy-loss spectroscopy (EELS) and X-ray fluorescence microscopy (XFM) to characterize Co-Pt nanoparticles

Microscopy and Microanalysis ◽

10.1017/s1431927621007613 ◽

2021 ◽

Vol 27 (S1) ◽

pp. 2108-2109

Author(s):

Alexandre Foucher ◽

Nicholas Marcella ◽

Anna Plonka ◽

Anatoly Frenkel ◽

Eric Stach

Keyword(s):

Fluorescence Microscopy ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Pt Nanoparticles ◽

X Ray ◽

Electron Energy Loss

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Surface characterization study of Ag, AgO, andAg2Ousing x-ray photoelectron spectroscopy and electron energy-loss spectroscopy

Physical Review B ◽

10.1103/physrevb.62.11126 ◽

2000 ◽

Vol 62 (16) ◽

pp. 11126-11133 ◽

Cited By ~ 232

Author(s):

Gar B. Hoflund ◽

Zoltan F. Hazos ◽

Ghaleb N. Salaita

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Photoelectron Spectroscopy ◽

Surface Characterization ◽

X Ray ◽

Characterization Study ◽

Electron Energy Loss

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Bias enhanced diamond nucleation onto 3C–SiC(100) surfaces studied by high resolution X-ray photoelectron and high resolution electron energy loss spectroscopies

Diamond and Related Materials ◽

10.1016/j.diamond.2008.01.032 ◽

2008 ◽

Vol 17 (3) ◽

pp. 377-382 ◽

Cited By ~ 8

Author(s):

J.-C. Arnault ◽

S. Saada ◽

Sh. Michaelson ◽

N.K. Hangaly ◽

R. Akhvlediani ◽

...

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Diamond Nucleation ◽

X Ray ◽

Resolution Electron ◽

Electron Energy Loss

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Summary Abstract: Characterization of planar aluminas by x‐ray photoelectron and electron energy loss spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573054 ◽

1985 ◽

Vol 3 (3) ◽

pp. 1313-1314 ◽

Cited By ~ 4

Author(s):

Erik D. Johnson ◽

Robert P. Merrill

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

X Ray ◽

Abstract Characterization ◽

Electron Energy Loss

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Extended x-ray-absorption and electron-energy-loss fine-structure studies of the local atomic structure of amorphous unhydrogenated and hydrogenated silicon carbide

Physical Review B ◽

10.1103/physrevb.38.13099 ◽

1988 ◽

Vol 38 (18) ◽

pp. 13099-13106 ◽

Cited By ~ 43

Author(s):

Alain E. Kaloyeros ◽

Richard B. Rizk ◽

John B. Woodhouse

Keyword(s):

Silicon Carbide ◽

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Atomic Structure ◽

Local Atomic Structure ◽

Hydrogenated Silicon ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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Mass thickness determination by electron energy loss for quantitative X-ray microanalysis in biology

Journal of Microscopy ◽

10.1111/j.1365-2818.1984.tb00489.x ◽

1984 ◽

Vol 133 (3) ◽

pp. 239-253 ◽

Cited By ~ 82

Author(s):

R. D. Leapman ◽

C. E. Fiori ◽

C. R. Swyt

Keyword(s):

Energy Loss ◽

Electron Energy ◽

X Ray ◽

Mass Thickness ◽

Thickness Determination ◽

Electron Energy Loss

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Microwave Fixation and Localization of Calcium in Synaptic Terminals and Muscular Cells by Electron Probe X-Ray Microanalysis and Electron Energy-Loss Spectroscopy Imaging.

ACTA HISTOCHEMICA ET CYTOCHEMICA ◽

10.1267/ahc.30.277 ◽

1997 ◽

Vol 30 (3) ◽

pp. 277-301 ◽

Cited By ~ 5

Author(s):

Vinci Mizuhira ◽

Hiroshi Hasegawa ◽

Mitsuru Notoya

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Electron Probe ◽

X Ray ◽

Synaptic Terminals ◽

Microwave Fixation ◽

Electron Energy Loss

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