A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
2000 ◽
Vol 75
(1)
◽
pp. 29-37
◽
1993 ◽
Vol 97
(28)
◽
pp. 7290-7294
◽
1997 ◽
Vol 12
(8)
◽
pp. 1942-1945
◽
2009 ◽
Vol 3
(4)
◽
pp. 559-565
◽
1994 ◽
pp. 143-152
1994 ◽
pp. 229-236
1993 ◽
Vol 32
(Part 1, No. 12B)
◽
pp. 6200-9202
◽