Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique
2009 ◽
Vol 3
(4)
◽
pp. 559-565
◽
1997 ◽
Vol 12
(8)
◽
pp. 1942-1945
◽
2000 ◽
Vol 75
(1)
◽
pp. 29-37
◽
1994 ◽
pp. 143-152
1994 ◽
pp. 229-236
1993 ◽
Vol 32
(Part 1, No. 12B)
◽
pp. 6200-9202
◽