High quality homoepitaxial CVD diamond for electronic devices

2001 ◽  
Vol 10 (3-7) ◽  
pp. 281-288 ◽  
Author(s):  
H. Okushi
2007 ◽  
Vol 31 (2) ◽  
pp. 1831-1838 ◽  
Author(s):  
Yukihiko Okumura ◽  
Kouichi Kanayama ◽  
Masaya Tabaru ◽  
Satoshi Kawabata

2018 ◽  
Vol 431 ◽  
pp. 152-159 ◽  
Author(s):  
Liang-xian Chen ◽  
Hao Liu ◽  
Sheng Liu ◽  
Cheng-ming Li ◽  
Yi-chao Wang ◽  
...  

2017 ◽  
Vol 77 ◽  
pp. 146-152 ◽  
Author(s):  
A. Tallaire ◽  
V. Mille ◽  
O. Brinza ◽  
Thu Nhi Tran Thi ◽  
J.M. Brom ◽  
...  

2020 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
Alexander N. Kalashnikov ◽  
Ali Elyounsi ◽  
Alan Holloway

The COVID-19 pandemic imposed various restrictions on the accessibility of conventional teaching laboratories. Enabling learning and experimenting at home became necessary to support the practical element of students’ learning. Unfortunately, it is not viable to provide or share a fully featured sensor lab to every student because of the prohibitive costs involved. Therefore, repurposing electronic devices that are common to students can bring about the sought-after practical learning experience without the hefty price tag. In distinction to the conventional lab instruments, however, consumer-grade devices are not designed for use with external sensors and/or electronic circuitry. They are not professionally maintained, do not undergo periodic safety tests, and are not calibrated. Nevertheless, nearly all modern computers, laptops, tablets or smartphones are equipped with high-quality audio inputs and outputs that can generate and record signals in the audible frequency range (20 Hz–20 kHz). Despite cutting off the direct currents completely, this range might be sufficient for working with a variety of sensors. In this presentation we look at the possibilities of making sure that such repurposing by design prevents any potential harm to the learner and to her or his personal equipment. These features seem essential for unsupervised lone experimenting and avoiding damage to expensive devices.


2004 ◽  
Vol 13 (4-8) ◽  
pp. 858-862 ◽  
Author(s):  
Tokuyuki Teraji ◽  
Satoshi Yoshizaki ◽  
Hideki Wada ◽  
Mitsuhiro Hamada ◽  
Toshimichi Ito

1985 ◽  
Vol 54 ◽  
Author(s):  
T. P. Smith ◽  
J. M. Phillips ◽  
R. People ◽  
J. M. Gibson ◽  
L. Pfeiffer ◽  
...  

ABSTRACTThe characterization of electronic devices using epitaxial CaF2 on Si is described. In addition, the growth and annealing techniques used to obtain high quality epitaxial films are discussed. In particular, the results of using rapid thermal annealing to improve the epitaxial quality of CaF2 films are presented in detail.The electronic and electrical properties of these structures are very promising. Epitaxial CaF2 films with breakdown fields as high as 3 × 106 V/cm and interface trap densities as low as 7 × 1010cm-2eV-1 have been fabricated. In addition, minority carrier dominated trapping has been observed at the CaF2 /Si interface. Finally, the material properties of these structures, as determined by Rutherford backscattering, channeling, and electron microscopy, are discussed and correlated with their electronic properties.


2005 ◽  
Vol 475-479 ◽  
pp. 3605-3610 ◽  
Author(s):  
S.G. Wang ◽  
P.J. Sellin ◽  
Q. Zhang ◽  
Fan Xiu Lu ◽  
Wei Zhong Tang ◽  
...  

In this study, X-ray detectors with coplanar metal-semiconductor-metal structure, were fabricated employing high quality chemical vapour deposited (CVD) diamond film grown by a direct current arc jet plasma system. In which the electrical contacts with dimension of 25 µm in width with a 25 µm inter-electrode spacing, were patterned on the growth side of the diamond film using lift-off technology. The performance of the fabricated detectors was evaluated by steady-state X-ray illumination. The photoconductivity of the diamond detectors was found to linearly increase with increase in the X-ray photon flux. This demonstrates that high quality CVD diamond can be used for X-ray detectors.


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