The Fabrication and Performance of CVD Diamond-Based X-Ray Detectors

2005 ◽  
Vol 475-479 ◽  
pp. 3605-3610 ◽  
Author(s):  
S.G. Wang ◽  
P.J. Sellin ◽  
Q. Zhang ◽  
Fan Xiu Lu ◽  
Wei Zhong Tang ◽  
...  
Keyword(s):  
Diamond Film ◽  
Chemical Vapour ◽  
Cvd Diamond ◽  
Electrical Contacts ◽  
Electrode Spacing ◽  
Photon Flux ◽  
High Quality ◽  
X Ray ◽  
Increase With Increase ◽  
Lift Off

In this study, X-ray detectors with coplanar metal-semiconductor-metal structure, were fabricated employing high quality chemical vapour deposited (CVD) diamond film grown by a direct current arc jet plasma system. In which the electrical contacts with dimension of 25 µm in width with a 25 µm inter-electrode spacing, were patterned on the growth side of the diamond film using lift-off technology. The performance of the fabricated detectors was evaluated by steady-state X-ray illumination. The photoconductivity of the diamond detectors was found to linearly increase with increase in the X-ray photon flux. This demonstrates that high quality CVD diamond can be used for X-ray detectors.

A uniformly cleaved epitaxically grown diamond crystal for synchrotron radiation

1998 ◽  
Vol 5 (3) ◽  
pp. 654-656 ◽  
Author(s):  
Armando H. Shinohara ◽  
Mutsukazu Kamo ◽  
Carlos K. Suzuki
Keyword(s):  
Diamond Film ◽  
Natural Diamond ◽  
Chemical Vapour ◽  
Cvd Diamond ◽  
Peak Position ◽  
X Rays ◽  
Double Crystal ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Cvd Diamond Film

A homoepitaxic single-crystal diamond (111) film grown by microwave-assisted chemical vapour deposition (CVD) and fractured along the [110] directions to form small triangles was investigated by X-ray double-crystal topography. The X-ray topographic image showed that all parts of the cleaved CVD diamond film sections uniformly reflected X-rays at the peak position of the rocking curve, which was measured in the Bragg case. Furthermore, no bending effect was observed and the CVD diamond film appeared to be more perfect than and showed higher integrated intensity than the natural diamond substrate.

A nanocrystalline CVD diamond film as an x-ray radiation detector

2006 ◽  
Vol 22 (2) ◽  
pp. 128-131 ◽  
Author(s):  
Linjun Wang ◽  
Jianmin Liu ◽  
Run Xu ◽  
Hongyan Peng ◽  
Weimin Shi ◽  
...  
Keyword(s):  
Diamond Film ◽  
Radiation Detector ◽  
Cvd Diamond ◽  
X Ray ◽  
Cvd Diamond Film

Soft X-ray photochemistry beamline at SPring-8

1998 ◽  
Vol 5 (3) ◽  
pp. 545-547 ◽  
Author(s):  
I. Koyano ◽  
M. Okuyama ◽  
E. Ishiguro ◽  
A. Hiraya ◽  
H. Ohashi ◽  
...  
Keyword(s):  
High Resolution ◽  
Chemical Vapour Deposition ◽  
Vapour Deposition ◽  
Chemical Vapour ◽  
X Rays ◽  
High Quality ◽  
X Ray ◽  
Excitation Region ◽  
Linearly Polarized ◽  
Grating Monochromator

Design and construction of a soft X-ray beamline at SPring-8 is reported. The beamline utilizes high-quality linearly polarized soft X-rays obtainable from a figure-8 undulator for the study of photophysical and photochemical processes of atoms, molecules and surfaces in the inner-shell excitation region. It consists of two experimental stations, a photochemistry station and a chemical vapour deposition (CVD) station. A high-resolution grating monochromator is installed at the photochemistry station, while the intense undispersed undulator radiation is used at the CVD station. Unique features of the experimental chambers and of the analysis and characterization systems are described along with those of the monochromator.

Characterization of soft-X-ray detectors fabricated with high-quality CVD diamond thin films

2008 ◽  
Vol 254 (19) ◽  
pp. 6277-6280 ◽  
Author(s):  
Y. Iwakaji ◽  
M. Kanasugi ◽  
O. Maida ◽  
Y. Takeda ◽  
Y. Saitoh ◽  
...  
Keyword(s):  
Thin Films ◽  
Cvd Diamond ◽  
High Quality ◽  
X Ray ◽  
Diamond Thin Films

Residual stress analysis of diamond-coated WC–Co cutting tools: separation of film and substrate information by grazing X-ray diffraction

2013 ◽  
Vol 46 (5) ◽  
pp. 1323-1330 ◽  
Author(s):  
M. Meixner ◽  
M. Klaus ◽  
Ch. Genzel ◽  
W. Reimers
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Cutting Tools ◽  
Chemical Vapour ◽  
Cvd Diamond ◽  
Diamond Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress State ◽  
Residual Stress Analysis

Chemical vapour deposition (CVD) of diamond surface layers is an effective way of improving the properties of cemented carbide cutting tools. Inadequate coating adhesion is one of the main issues and it may be affected by the residual stresses of the CVD diamond films. The most common methods for nondestructive residual stress analysis are based on X-ray diffraction. The present paper deals with the particular case of determining the residual stress state of thin CVD diamond layers deposited on cobalt cemented tungsten carbide (WC–Co) substrates. It will be shown that the application of the conventional sin2ψ method might lead to erroneous results, as a result of superimposing diffraction lines originating from cobalt and the diamond coating. An approach to separating information on the substrate and film, based on grazing conditions in the symmetrical Ψ mode of diffraction, is presented. The results, revealing large compressive stresses within the coating, are compared with those obtained by supplementary micro-Raman spectroscopy investigations.

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