A seminumerical method to determine the depth profile of the three dimensional residual stress state with X-ray diffraction
Keyword(s):
X Ray
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2009 ◽
Vol 50
(2)
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pp. 195-204
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1985 ◽
Vol 107
(2)
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pp. 185-191
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2010 ◽
Vol 652
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pp. 37-43
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2008 ◽
Vol 571-572
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pp. 421-425