scholarly journals A Plane Quartic with Eight Undulations

1950 ◽  
Vol 8 (4) ◽  
pp. 147-162 ◽  
Author(s):  
W. L. Edge
Keyword(s):  
Point Contact ◽  
Quartic Curve ◽  
Image Position

1. The chief purpose of this paper is to demonstrate the existence of a plane quartic curve with eight undulations, an “undulation” being a point at which the tangent has four-point contact. It is shown that the curvewhere (x, y, z) are homogeneous point-coordinates and f a constant, has undulations at the eight points The curve has, in addition to these undulations, eight inflections which are; in general, distinct. But there are two geometrically different possibilities of their not being distinct, and in either instance they coincide in pairs at four further undulations. Thus two types of curve arise without any ordinary inflections at all, their 24 inflections coinciding in pairs at 12 undulations.

scholarly journals A plane quartic curve with twelve undulations

1945 ◽  
Vol 35 ◽  
pp. 10-13 ◽  
Author(s):  
W. L. Edge
Keyword(s):  
Homogeneous Coordinates ◽  
Quartic Curve ◽  
Base Points ◽  
Octahedral Group ◽  
Quartic Form ◽  
Image Position ◽  
Quartic Curves ◽  
Set Of Points

The pencil of quartic curveswhere x, y, z are homogeneous coordinates in a plane, was encountered by Ciani [Palermo Rendiconli, Vol. 13, 1899] in his search for plane quartic curves that were invariant under harmonic inversions. If x, y, z undergo any permutation the ternary quartic form on the left of (1) is not altered; nor is it altered if any, or all, of x, y, z be multiplied by −1. There thus arises an octahedral group G of ternary collineations for which every curve of the pencil is invariant.Since (1) may also be writtenthe four linesare, as Ciani pointed out, bitangents, at their intersections with the conic C whose equation is x2 + y2 + z2 = 0, to every quartic of the pencil. The 16 base points of the pencil are thus all accounted for—they consist of these eight contacts counted twice—and this set of points must of course be invariant under G. Indeed the 4! collineations of G are precisely those which give rise to the different permutations of the four lines (2), a collineation in a plane being determined when any four non-concurrent lines and the four lines which are to correspond to them are given. The quadrilateral formed by the lines (2) will be called q.

Geometrical Properties of Three Symmetric Matrices

1935 ◽  
Vol 31 (2) ◽  
pp. 174-182 ◽  
Author(s):  
H. W. Turnbull
Keyword(s):  
Explicit Form ◽  
Three Dimensions ◽  
Symmetric Matrices ◽  
Geometrical Properties ◽  
Cubic Surface ◽  
Quadric Surfaces ◽  
Quartic Curve ◽  
Polar Property ◽  
Linear Complexes ◽  
Image Position

In the early editions of the Geometry of Three Dimensions Salmon had stated that the equations of any three quadric surfaces could be simultaneously reduced to the sums of five squares. Such a reduction is not possible in general, but can be performed if and only if a certain combinant Λ, of the net of quadrics, vanishes. Algebraically the theory of such a net of quadrics is equivalent, as Hesse(2) showed, to that of a plane quartic curve: and the condition for the equation a quartic to be expressible to the sum of five fourth powers is equivalent to the condition Λ = 0(1). While Clebsch(3) was the first to establish this condition, Lüroth(4) gave it more explicit form by studying the quartic curvewhich satisfies the condition. Frahm(5) seems to have been the first to prove the impossibility of the above reduction of three general quadric surfaces, by remarking that the plane quartic curve obtained in Hesse's way from the locus of the vertices of cones of the net of quadrics would be a Lüroth quartic. Frahm further remarked that the three quadrics, so conditioned, could be regarded as the polar quadrics belonging to a cubic surface in ∞2 ways; but that for three general quadrics no such cubic surface exists. An explicit algebraical account of these properties was given by E. Toeplitz(6), who incidentally noticed that certain linear complexes associated with three general quadrics became special linear complexes when Λ = 0. This polar property of three quadrics in [3] was generalized to n dimensions by Anderson (7).

Is every quartic a conic of conics?

1991 ◽  
Vol 109 (3) ◽  
pp. 419-424 ◽  
Author(s):  
C. T. C. Wall
Keyword(s):  
Complex Numbers ◽  
Quartic Curve ◽  
Quartic Polynomial ◽  
Image Position

The question of the title is to be interpreted as follows. Given a homogeneous nonzero quartic polynomial ø(x1, x2, x3), can one always find homogeneous quadraticsc, q1, q2, q3in three variables such thatI am indebted to Ulf Persson for asking this question, the answer to which is intimately related to the singularities of the projective quartic curve Γ defined by ø = 0. We work throughout over the field ℂ of complex numbers.

Involutions on a Normal Quartic Curve in Space of Four Dimensions

1924 ◽  
Vol 22 (1) ◽  
pp. 24-25
Author(s):  
C. G. F. James
Keyword(s):  
Canonical Representation ◽  
Space Representation ◽  
Present System ◽  
Four Dimensions ◽  
Cubic Form ◽  
Principal Curve ◽  
Quartic Curve ◽  
Image Position

The object of this note is to correct an error in my paper “Extensions of a theorem of Segre's…,” the notation used being the same. The curve C4 dealt with is regarded as given by its canonical representationand at one point in the paper we sought the locus of the lines analogous to the line A2A4 of the figure of reference for each of the ∞2 representations of this type (p. 671, small print). In the space representation of the locus there is an additional principal curveand the order of the locus must be reduced by that of the form corresponding to the points of this conic. The locus sought is in fact none other than the cubic form, locus of chords of C4, the present system of lines being the directrix systemt†. This follows at once from the following results, which can be shown immediately using the above representation:(1) The space joining such a line g to any tangent cuts the curve again in coincident points, and thus contains a second tangent;(2) The line joining the points of contact of these tangents meets g, and the points give the involution

scholarly journals Appearance of quantum point contact in Pt/NiO/Pt resistive switching cells

2017 ◽  
Vol 32 (14) ◽  
pp. 2631-2637 ◽  
Author(s):  
Yusuke Nishi ◽  
Hiroki Sasakura ◽  
Tsunenobu Kimoto
Keyword(s):  
Resistive Switching ◽  
Point Contact ◽  
Quantum Point Contact ◽  
Quantum Point ◽  
Image Position

Abstract

Simple Identification of Electron Diffraction Ring Patterns

1969 ◽  
Vol 27 ◽  
pp. 160-161
Author(s):  
Carolyn Nohr ◽  
Ann Ayres
Keyword(s):  
Electron Microscope ◽  
Electron Diffraction ◽  
Diffraction Ring ◽  
Image Position

Texts on electron diffraction recommend that the camera constant of the electron microscope be determine d by calibration with a standard crystalline specimen, using the equation

Atomic orientation effects in proton stopping at low velocity

1983 ◽  
Vol 41 ◽  
pp. 708-709
Author(s):  
Kin Lam
Keyword(s):  
Polycrystalline Material ◽  
Charged Particles ◽  
Target Material ◽  
Stopping Power ◽  
Low Velocity ◽  
Electronic Density ◽  
Interatomic Distances ◽  
Frame Work ◽  
Image Position ◽  
Atomic Orientation

The energy of moving ions in solid is dependent on the electronic density as well as the atomic structural properties of the target material. These factors contribute to the observable effects in polycrystalline material using the scanning ion microscope. Here we outline a method to investigate the dependence of low velocity proton stopping on interatomic distances and orientations.The interaction of charged particles with atoms in the frame work of the Fermi gas model was proposed by Lindhard. For a system of atoms, the electronic Lindhard stopping power can be generalized to the formwhere the stopping power function is defined as

A Magnetic Spectrometer for a Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 436-437
Author(s):  
A. Kosiara ◽  
J. W. Wiggins ◽  
M. Beer
Keyword(s):  
Scanning Transmission Electron Microscope ◽  
Magnetic Spectrometer ◽  
Fringe Field ◽  
Curvature Radius ◽  
Magnetic Pole ◽  
Quadrupole Field ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Under Construction ◽  
Image Position

A magnetic spectrometer to be attached to the Johns Hopkins S. T. E. M. is under construction. Its main purpose will be to investigate electron interactions with biological molecules in the energy range of 40 KeV to 100 KeV. The spectrometer is of the type described by Kerwin and by Crewe Its magnetic pole boundary is given by the equationwhere R is the electron curvature radius. In our case, R = 15 cm. The electron beam will be deflected by an angle of 90°. The distance between the electron source and the pole boundary will be 30 cm. A linear fringe field will be generated by a quadrupole field arrangement. This is accomplished by a grounded mirror plate and a 45° taper of the magnetic pole.

Optimizing conditions for x-ray microchemical analysis in analytical electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 548-549 ◽  
Author(s):  
N. J. Zaluzec
Keyword(s):  
Solid Angle ◽  
Analytical Electron Microscopy ◽  
Incident Beam ◽  
Thin Foil ◽  
Experimental Conditions ◽  
X Ray ◽  
Microchemical Analysis ◽  
Analytical Electron ◽  
Image Position ◽  
Incident Beam Energy

The ultimate sensitivity of microchemical analysis using x-ray emission rests in selecting those experimental conditions which will maximize the measured peak-to-background (P/B) ratio. This paper presents the results of calculations aimed at determining the influence of incident beam energy, detector/specimen geometry and specimen composition on the P/B ratio for ideally thin samples (i.e., the effects of scattering and absorption are considered negligible). As such it is assumed that the complications resulting from system peaks, bremsstrahlung fluorescence, electron tails and specimen contamination have been eliminated and that one needs only to consider the physics of the generation/emission process.The number of characteristic x-ray photons (Ip) emitted from a thin foil of thickness dt into the solid angle dΩ is given by the well-known equation

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

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