Determination of a-Axis Orientations of Polycrystalline Ice
1979 ◽
Vol 22
(86)
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pp. 165-169
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AbstractTwo new methods have been devised for measurement of crystallographic lattice orientations of individual crystals in polycrystalline ice. The first uses edge-length ratios of etch pits. The second uses a combination of optical measurement on a thin section and etch-pit technique. Although the second method does not work for crystals with theirc-axis oriented parallel to the thin section, it is much simpler and more practical than the first method. When used on polycrystalline glacier ice, this method gave the threea-axes orientations as well asc-axis orientation for each crystal with an accuracy of 5°.
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2011 ◽
Vol 245
(3)
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pp. 276-287
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1935 ◽
Vol 27
(1)
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pp. 1-7
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1997 ◽
Vol 36
(11)
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pp. 101-106
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Keyword(s):
2003 ◽
Vol 377
(2)
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pp. 316-321
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