scholarly journals Spatially Resolved X-Ray Spectra of Coronal Active Regions

1975 ◽  
Vol 68 ◽  
pp. 67-67
Author(s):  
R. C. Catura ◽  
L. W. Acton ◽  
E. G. Joki ◽  
C. G. Rapley ◽  
J. L. Culhane
Keyword(s):  
Diffraction Pattern ◽  
Proportional Counter ◽  
Active Regions ◽  
Solar Image ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Bent Crystal ◽  
Spatially Resolved ◽  
Position Sensitive ◽  
Multiple Spot

SummaryX-ray spectra from a number of coronal active regions were obtained during ATM support rocket flights carried out by the Lockheed group on June 11 and December 19, 1973. Multi-grid collimators were used to provide fields of view of 40″ diameter and 90″ diameter for a number of scanning crystal spectrometers and a bent crystal spectrometer which employed a position sensitive proportional counter to register the diffracted spectrum. A solar image was produced on film and on a TV camera on board the rocket with the aid of a 1 Å Hα filter. A small part of the X-ray collimator was used to generate a multiple spot diffraction pattern which was superimposed on the Hα image and the composite picture was transmitted to the ground. Pre-launch calibrations allowed the spot corresponding to the X-ray collimator axis to be identified and so the collimator pointing direction on the solar disc was controlled from the ground by means of commands sent to the rocket.

scholarly journals Soft X-Ray Spectroscopy from the X-Ray Polychromator on the Newly Repaired Solar Maximum Mission

1984 ◽  
Vol 86 ◽  
pp. 9-11
Author(s):  
K.T. Strong ◽  
R.A. Stern ◽  
J.R. Lemen ◽  
K.J.H. Phillips
Keyword(s):  
Spectroscopic Data ◽  
Solar Maximum ◽  
Active Regions ◽  
Line Profiles ◽  
Crystal Spectrometer ◽  
Solar Maximum Mission ◽  
X Ray ◽  
Bent Crystal ◽  
Mission Satellite ◽  
Short Presentation

The X-Ray Polychromator (XRP) resumed operations on 24 April 1984 following the successful in-orbit repair of the Solar Maximum Mission Satellite. Since that time the two instruments that comprise the XRP, the Flat Crystal Spectrometer (FCS) and the Bent Crystal Spectrometer (BCS), have been used to obtain new spectroscopic data from active regions and flares. The FCS, in particular, has accumulated far more observations of soft X-ray line profiles than were obtained during SMM-I in 1980. For this short presentation, we have chosen two topics to illustrate the type of data that we have obtained since the repair.

Elliptically Bent Crystal Spectrometer for Z-Pinch Plasma X-Ray

2009 ◽  
Vol 36 (1) ◽  
pp. 115-118
Author(s):  
王洪建 Wang Hongjian ◽  
肖沙里 Xiao Shali ◽  
施军 Shi Jun ◽  
黄显宾 Huang Xianbin ◽  
杨礼兵 Yang Libing ◽  
...  
Keyword(s):  
Crystal Spectrometer ◽  
X Ray ◽  
Pinch Plasma ◽  
Bent Crystal ◽  
Z Pinch

scholarly journals Detailed X-ray Observations of the Cygnus Loop

1983 ◽  
Vol 101 ◽  
pp. 253-260
Author(s):  
W. H.-M. Ku ◽  
K. Long ◽  
R. Pisarski ◽  
M. Vartanian
Keyword(s):  
High Resolution ◽  
Proportional Counter ◽  
Supernova Remnant ◽  
Sounding Rocket ◽  
Loop Structure ◽  
High Quality ◽  
Radio Structure ◽  
X Ray ◽  
Cygnus Loop ◽  
Spatially Resolved

High quality X-ray spectral and imaging observations of the Cygnus Loop have been obtained with three different instruments. The High Resolution Imager (HRI) on the Einstein Observatory was used to obtain arcsecond resolution images of select bright regions in the Cygnus Loop which permit detailed comparisons between the X-ray, optical, and radio structure of the Loop. The Imaging Proportional Counter (IPC) on the Einstein Observatory was used to obtain an arcminute resolution map of essentially the full Loop structure. Finally, an Imaging Gas Scintillation Proportional Counter (IGSPC), carried aloft by a sounding rocket last fall, obtained modest resolution, spatially resolved spectrophotometry of the Cygnus Loop. An X-ray map of the Loop in the energy of the 0 VIII line was obtained. These data combine to yield a very powerful probe of the abundance, temperature, and density distribution of material in the supernova remnant, and in the interstellar medium.

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Proportional Counter ◽  
Anisotropic Scattering ◽  
Photon Flux ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.

scholarly journals Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

2014 ◽  
Vol 21 (4) ◽  
pp. 762-767 ◽  
Author(s):  
Ari-Pekka Honkanen ◽  
Roberto Verbeni ◽  
Laura Simonelli ◽  
Marco Moretti Sala ◽  
Ali Al-Zein ◽  
...  
Keyword(s):  
High Resolution ◽  
Internal Stress ◽  
Photon Energy ◽  
Energy Resolution ◽  
Preceding Paper ◽  
X Ray ◽  
Bent Crystal ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Bent Crystals

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanenet al.(2014).J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.

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