In Situ Deformation by High Voltage Electron Microscopy

Author(s):  
H. Fujita

It is well known that materials are structure-sensitive. This means that properties of materials, especially mechanical properties, are determined by behavior of the lattice imperfections such as dislocations and point defects. High resolution and quick recording of the images by electron microscopy have been effectively used for studying behavior of lattice imperfections. It is very difficult, however, to get a definite conclusion about the deformation processes based on the static electron microscope observation of the dislocation structures formed by deformation, because many processes can be considered to get the same dislocation structure. Therefore, dynamic study of the behavior of lattice imperfections is necessary to carry out in order to investigate the properties of materials.

Author(s):  
J. A. Pollock ◽  
M. Martone ◽  
T. Deerinck ◽  
M. H. Ellisman

Localization of specific proteins in cells by both light and electron microscopy has been facilitate by the availability of antibodies that recognize unique features of these proteins. High resolution localization studies conducted over the last 25 years have allowed biologists to study the synthesis, translocation and ultimate functional sites for many important classes of proteins. Recently, recombinant DNA techniques in molecular biology have allowed the production of specific probes for localization of nucleic acids by “in situ” hybridization. The availability of these probes potentially opens a new set of questions to experimental investigation regarding the subcellular distribution of specific DNA's and RNA's. Nucleic acids have a much lower “copy number” per cell than a typical protein, ranging from one copy to perhaps several thousand. Therefore, sensitive, high resolution techniques are required. There are several reasons why Intermediate Voltage Electron Microscopy (IVEM) and High Voltage Electron Microscopy (HVEM) are most useful for localization of nucleic acids in situ.


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