A microdiffraction study of Os10C(Co)24-2 in the Scanning Transmission Electron Microscope

1986 ◽  
Vol 44 ◽  
pp. 696-697 ◽  
Author(s):  
M. E. Mochel ◽  
R. I. Masel ◽  
J. M. Mochel
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Structural Information ◽  
Carbon Film ◽  
Scanning Transmission Electron Microscope ◽  
Metal Particles ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Small Metal Particles

Recent papers have discussed some of the difficulties in determining the structure of very small (<10Å) metal particles using electron microscopy. One of the ideas in the literature is that electron diffraction could provide structural information even under conditions where imaging is difficult. The purpose of the work reported here is to demonstrate that one can use electron diffraction techniques to obtain structural information about small metal particles, in this case 5Å osmium particles on a carbon film.

Development of 200 kV Scanning-Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 410-411
Author(s):  
H. Koike ◽  
S. Sakurai ◽  
K. Ueno ◽  
M. Watanabe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
The Other ◽  
Morphological Observation ◽  
Magnetic Domains ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Backscattered Electron ◽  
Increasing Demand

In recent years, there has been increasing demand for higher voltage SEMs, in the field of surface observation, especially that of magnetic domains, dislocations, and electron channeling patterns by backscattered electron microscopy. On the other hand, the resolution of the CTEM has now reached 1 ∼ 2Å, and several reports have recently been made on the observation of atom images, indicating that the ultimate goal of morphological observation has beem nearly achieved.

scholarly journals Serial protein crystallography in an electron microscope

2019 ◽  
Author(s):  
Robert Bücker ◽  
Pascal Hogan-Lamarre ◽  
Pedram Mehrabi ◽  
Eike C. Schulz ◽  
Lindsey A. Bultema ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Electron Diffraction ◽  
Scanning Transmission Electron Microscope ◽  
Dose Fractionation ◽  
X Ray Crystallography ◽  
Minimal Sample ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Alternative Means ◽  
Occlusion Bodies

AbstractSerial X-ray crystallography at free-electron lasers allows to solve biomolecular structures from sub-micron-sized crystals. However, beam time at these facilities is scarce, and involved sample delivery techniques are required. On the other hand, rotation electron diffraction (MicroED) has shown great potential as an alternative means for protein nano-crystallography. Here, we present a method for serial electron diffraction of protein nanocrystals combining the benefits of both approaches. In a scanning transmission electron microscope, crystals randomly dispersed on a sample grid are automatically mapped, and a diffraction pattern at fixed orientation is recorded from each at a high acquisition rate. Dose fractionation ensures minimal radiation damage effects. We demonstrate the method by solving the structure of granulovirus occlusion bodies and lysozyme to resolutions of 1.55 Å and 1.80 Å, respectively. Our method promises to provide rapid structure determination for many classes of materials with minimal sample consumption, using readily available instrumentation.

On-Line Aberration Measurement and Correction in STEM

1997 ◽  
Vol 3 (S2) ◽  
pp. 1171-1172 ◽  
Author(s):  
Ondrej L. Krivanek ◽  
Niklas Dellby ◽  
Andrew J. Spence ◽  
Roger A. Camps ◽  
L. Michael Brown
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Spherical Aberration ◽  
Computer Control ◽  
Beam Current ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron ◽  
Probe Size ◽  
Scanning Transmission ◽  
On Line

Aberration correction in electron microscopy is a subject with a 60 year history dating back to the fundamental work of Scherzer. There have been several partial successes, such as Deltrap's spherical aberration (Cs) corrector which nulled Cs over 30 years ago. However, the practical goal of attaining better resolution than the best uncorrected microscope operating at the same voltage remains to be fulfilled. Combining well-known electron-optical principles with stable electronics, versatile computer control, and software able to diagnose and correct aberrations on-line is at last bringing this goal within reach.We are building a quadrupole-octupole Cs corrector with automated aberration diagnosis for a VG HB5 dedicated scanning transmission electron microscope (STEM). A STEM with no spherical aberration will produce a smaller probe size with a given beam current than an uncorrected STEM, and a larger beam current in a given size probe.

Cutting of 20 Å holes and lines in metal-β-aluminas

1983 ◽  
Vol 41 ◽  
pp. 100-101 ◽  
Author(s):  
M.E. Mochel ◽  
C. J. Humphreys ◽  
J. M. Mochel ◽  
J. A. Eades
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Carbon Film ◽  
Scanning Transmission Electron Microscope ◽  
High Electron ◽  
Transmission Electron ◽  
Solid Substrates ◽  
Scanning Transmission ◽  
Very High

Holes 20 Å in diameter and fine lines 20 Å wide can be cut in the metal-β-aluminas using the 10 Å electron beam of the Vacuum Generators, HB5 scanning transmission electron microscope. The minimum current density required for cutting was 103 amp/cm2. Electron energies of 40,60,80,100 keV were used.This technique has higher resolution than current lithography methods and is direct, requiring no chemical development. The width of isolated lines made on solid substrates is currently about .1μm (Ahmed and McMahon, 1981) and .03μm (Jackel et al., 1980). M. Isaacson and A. Murry have carried out electron beam writing on NaCl crystals supported on a carbon film on the scale we report here.In our case uniform 20Å holes and lines can be cut through self-supporting 1000A thick slabs of sodium-β-alumina to provide very high electron contrast. Once cut, the β-aluminas are stable and will tolerate exposure to air without degradation of the electron cut patterns. They may be used directly as masks (eg. for ion implantation). We believe they could be cut on the substrate with no damage to the underlying material.

Observation of Atom Images by Means of Field Emission Stem

1976 ◽  
Vol 34 ◽  
pp. 500-501
Author(s):  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
Carbon Film ◽  
Dark Field Image ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Single Atom ◽  
Bright Field Image ◽  
Contrast Effects ◽  
Transmission Electron ◽  
Scanning Transmission

A number of studies of single atom image observation utilizing either scanning transmission electron microscope ( STEM ) or conventional electron microscope ( OEM ) have been reported. For this purpose, the dark field image observation seems more promising because the scattering cross-section of an atom is extremely small. Much attention has been paid to decreasing background noises resulting from the supporting film. A thin amorphous carbon film is often utilized as a supporting film. However, many high contrast spots appear even in the dark field image when OEM is used. Matsuda and Nagata3 applied an incoherent illumination technique to the bright field image observation of OEM, and succeeded, in removing the phase contrast effects from the image.

Analytical electron microscopy of fresh and vehicle-aged catalysts

1988 ◽  
Vol 46 ◽  
pp. 714-715
Author(s):  
Sooho Kim
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Analytical Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Automotive Catalysts ◽  
Area Reduction ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Scanning Transmission

Automotive catalysts have a general loss of activity during aging, basically due to two principal deactivation mechanisms. One of them is thermally induced “sintering,” which results in catalytic surface area reduction. The other is chemically induced “poisoning,” which in part causes blockage of active metal sites. The conventional bulk techniques have indicated that various catalyst functions were affected differently by poisons and thermal damage; however, they generally did not provide detailed descriptions of the mechanisms of deactivation. Only analytical electron microscopy (AEM) can provide microchemical and microstructural information to gain a more thorough and fundamental understanding of catalytic deactivation.Fresh and vehicle-aged commercial automotive catalysts containing Pt, Pd, and Rh on alumina supports were prepared for AEM by a microtomy technique, which retains the spatial integrity of the catalyst pellet with uniform thickness. Then these AEM specimens were characterized in a transmission electron microscope (TEM) and in a dedicated scanning transmission electron microscope (STEM).

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