Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
2008 ◽
Vol 14
(S2)
◽
pp. 104-105
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Keyword(s):
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
2009 ◽
Vol 15
(5)
◽
pp. 441-453
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2008 ◽
Vol 14
(S2)
◽
pp. 1400-1401
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1993 ◽
Vol 170
(3)
◽
pp. 229-236
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2008 ◽
Vol 14
(S2)
◽
pp. 1048-1049
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2010 ◽
Vol 16
(4)
◽
pp. 445-455
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2009 ◽
Vol 15
(S2)
◽
pp. 1418-1419
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