Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes

2008 ◽  
Vol 14 (S2) ◽  
pp. 104-105 ◽  
Author(s):  
PD Nellist ◽  
EC Cosgriff ◽  
G Behan ◽  
AI Kirkland ◽  
AJ D'Alfonso ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

2009 ◽  
Vol 15 (5) ◽  
pp. 441-453 ◽  
Author(s):  
A.R. Lupini ◽  
A.Y. Borisevich ◽  
J.C. Idrobo ◽  
H.M. Christen ◽  
M. Biegalski ◽  
...  

AbstractThe successful development of third-order aberration correctors in transmission electron microscopy has seen aberration-corrected electron microscopes evolve from specialist projects, custom built at a small number of sites to common instruments in many modern laboratories. Here we describe some initial results illustrating the two- and three-dimensional (3D) performance of an aberration-corrected scanning transmission electron microscope with a prototype improved aberration corrector designed to also minimize fifth-order aberrations and a new, higher brightness gun. We show that atomic columns separated by 0.63 Å can be resolved and demonstrate detection of single dopant atoms with 3D sensitivity.


2008 ◽  
Vol 126 ◽  
pp. 012036
Author(s):  
E C Cosgriff ◽  
A J D'Alfonso ◽  
L J Allen ◽  
S D Findlay ◽  
A I Kirkland ◽  
...  

2005 ◽  
Vol 13 (5) ◽  
pp. 34-35
Author(s):  
Ted Clarke

The stereo microscope is the most commonly used microscope. This applies to both the materials science and biological science fields. My past career as a materials engineer depended critically upon the three dimensional imaging of the stereo microscope for studying metal parts and fracture surfaces. Unfortunately our clients had no readily available way to view stereo pairs, so stereo pair recording was not done. Likewise, our electron microscopes were not equipped with costly eucentric stages, which make stereo pair recording easily done.


2008 ◽  
Vol 14 (S2) ◽  
pp. 1400-1401 ◽  
Author(s):  
M Watanabe ◽  
M Kanno ◽  
D Ackland ◽  
CJ Kiely ◽  
DB Williams

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


2008 ◽  
Vol 14 (S2) ◽  
pp. 1048-1049 ◽  
Author(s):  
L Jiang ◽  
P Wang ◽  
A Bleloch ◽  
P Goodhew

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


2010 ◽  
Vol 16 (4) ◽  
pp. 445-455 ◽  
Author(s):  
Huolin L. Xin ◽  
David A. Muller

AbstractThis article focuses on the development of a transparent and uniform understanding of possibilities for three-dimensional (3D) imaging in scanning transmission and confocal electron microscopes (STEMs and SCEMs), with an emphasis on the annular dark-field STEM (ADF-STEM), bright-field SCEM (BF-SCEM), and ADF-SCEM configurations. The incoherent imaging approximation and a 3D linear imaging model for ADF-STEM are reviewed. A 3D phase contrast model for coherent-SCEM as well as a pictorial way to find boundaries of information transfer in reciprocal space are reviewed and applied to both BF- and ADF-SCEM to study their 3D point spread functions and contrast transfer functions (CTFs). ADF-STEM is capable of detecting the depths of dopant atoms in amorphous materials but can fail for crystalline materials when channeling substantially modifies the electron propagation. For the imaging of extended (i.e., nonpointlike) features, ADF-STEM and BF-SCEM exhibit strong elongation artifacts due to the missing cone of information. ADF-SCEM shows an improvement over ADF-STEM/BF-SCEM due to its differential phase contrast eliminating slowly varying backgrounds, an effect that partially suppresses the elongation artifacts. However, the 3D CTF still has a cone of missing information that will result in some residual feature elongation as has been observed in A. Hashimoto et al., J Appl Phys160(8), 086101 (2009).


2009 ◽  
Vol 15 (S2) ◽  
pp. 1418-1419 ◽  
Author(s):  
JK Hyun ◽  
ZY Liu ◽  
DA Muller

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009


Sign in / Sign up

Export Citation Format

Share Document