Preparation of AlGaN-based High Electron Mobility Transistor Devices using Focused Ion Beam Milling
2008 ◽
Vol 14
(S2)
◽
pp. 1030-1031
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Keyword(s):
Ion Beam
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
1998 ◽
Vol 31
(2)
◽
pp. 159-164
◽
2006 ◽
Vol 45
(No. 35)
◽
pp. L932-L934
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