Site specific He ion irradiation damage studies in nanolayered thin films by cross-coupling Helium Ion Microscopy with TEM and APT
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
1979 ◽
Vol 39
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pp. 355-377
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1990 ◽
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2018 ◽
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pp. 379-387
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2020 ◽
Vol 121
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pp. 103241
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