scholarly journals Internal Temperature Calibration at Nanoscale on in situ Heating High Resolution Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 498-499 ◽  
Author(s):  
Y. Lan ◽  
H. Wang ◽  
G. Chen ◽  
Z. Ren
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Temperature Calibration ◽  
Internal Temperature ◽  
Transmission Electron ◽  
In Situ Heating

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

In-Situ Transmission Electron Microscopy and Computer Simulation Study of the Kinetics of Oxygen Loss in Yba2Cu3OZ

1989 ◽  
Vol 169 ◽  
Author(s):  
C. P. Burmester ◽  
L. T. Wille ◽  
R. Gronsky ◽  
B. T. Ahn ◽  
V. Y. Lee ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulation Study ◽  
Oxygen Loss ◽  
Domain Structures ◽  
Transmission Electron ◽  
Kinetics Of ◽  
Image Simulations

AbstractHigh resolution transmission electron microscopy during in‐situ quenching of YBa2Cu3Oz is used to study the kinetics of microdomain formation during oxygen loss in this system. Image simulations based on atomic models of oxygen‐vacancy order in the basal plane of this material generated by Monte Carlo calculations are used to interpret high resolution micrographs of the structures obtained by quenching. The observed domain structures agree well with those obtained from the simualtions.

scholarly journals Methods for Calibration of Specimen Temperature During In Situ Transmission Electron Microscopy Experiments

2020 ◽  
Vol 26 (1) ◽  
pp. 3-17 ◽  
Author(s):  
Fabrizio Gaulandris ◽  
Søren B. Simonsen ◽  
Jakob B. Wagner ◽  
Kristian Mølhave ◽  
Shun Muto ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Temperature Calibration ◽  
Transmission Electron ◽  
Calibration Methods ◽  
Scanning Transmission ◽  
Stem Temperature ◽  
Temperature Ranges ◽  
Technological Improvements

AbstractOne of the biggest challenges for in situ heating transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) is the ability to measure the local temperature of the specimen accurately. Despite technological improvements in the construction of TEM/STEM heating holders, the problem of being able to measure the real sample temperature is still the subject of considerable discussion. In this study, we review the present literature on methodologies for temperature calibration. We analyze calibration methods that require the use of a thermometric material in addition to the specimen under study, as well as methods that can be performed directly on the specimen of interest without the need for a previous calibration. Finally, an overview of the most important characteristics of all the treated techniques, including temperature ranges and uncertainties, is provided in order to provide an accessory database to consult before an in situ TEM/STEM temperature calibration experiment.

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