scholarly journals C60 Secondary Ion FT-ICR Mass Spectrometry: High Mass Resolving Power and High Mass Accuracy SIMS

2013 ◽  
Vol 19 (S2) ◽  
pp. 660-661
Author(s):  
L. Pasa-Tolic ◽  
D.F. Smith ◽  
F.E. Leach ◽  
E.W. Robinson ◽  
R.M. Heeren

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

2013 ◽  
Vol 405 (18) ◽  
pp. 6069-6076 ◽  
Author(s):  
Donald F. Smith ◽  
Andras Kiss ◽  
Franklin E. Leach ◽  
Errol W. Robinson ◽  
Ljiljana Paša-Tolić ◽  
...  

2020 ◽  
Vol 92 (4) ◽  
pp. 3133-3142 ◽  
Author(s):  
Andrew P. Bowman ◽  
Greg T. Blakney ◽  
Christopher L. Hendrickson ◽  
Shane R. Ellis ◽  
Ron M. A. Heeren ◽  
...  

2019 ◽  
Vol 34 (6) ◽  
pp. 1098-1108 ◽  
Author(s):  
Pietro Benettoni ◽  
Hryhoriy Stryhanyuk ◽  
Stephan Wagner ◽  
Felix Kollmer ◽  
Jairo H. Moreno Osorio ◽  
...  

ToF-SIMS boundaries were pushed to enhance lateral resolution and mass resolving power for chemical imaging of nanoparticles in biological systems.


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