scholarly journals Advances in Elemental Electron Tomography for the State-of-the-art Semiconductor Devices and Circuits Characterization and Failure Analysis

2017 ◽  
Vol 23 (S1) ◽  
pp. 1456-1457 ◽  
Author(s):  
B. Fu ◽  
M Gribelyuk ◽  
Frieder H. Baumann ◽  
C. Fang ◽  
Wayne Zhao ◽  
...  
2003 ◽  
Vol 9 (S02) ◽  
pp. 174-175
Author(s):  
Jürgen M. Plitzko ◽  
Stephan Nickell ◽  
Günte Pfeifer ◽  
Wolfgang Baumeister

2018 ◽  
Vol 924 ◽  
pp. 547-551
Author(s):  
Dirk Lewke ◽  
Mercedes Cerezuela Barreto ◽  
Karl Otto Dohnke ◽  
Hans Ulrich Zühlke ◽  
Christian Belgardt ◽  
...  

With the gaining demand for SiC semiconductor devices it is more and more challenging to meet the requirements for SiC volume production with the state of the art wafer dicing technology. In order to overcome this challenge the laser based dicing technology Thermal Laser Separation (TLS-DicingTM) was assessed for SiC volume production within the European project SEA4KET. This paper presents the key results of this project. It could be demonstrated that the demand of SiC volume production regarding throughput and cost as well as edge quality and electrical performance of diced chips can be met with TLS-DicingTM.


2020 ◽  
Vol 96 (3s) ◽  
pp. 164-168
Author(s):  
Е.М. Гейфман ◽  
И.В. Грехов ◽  
Г.Ю. Каменцев ◽  
А.Ю. Петров ◽  
В.В. Чибиркин

Силовые полупроводниковые приборы (СПП) являются основной электронной компонентной базой для мощной силовой электроники и импульсной техники, для важнейших областей экономики России. Состояние производства СПП оказывает существенное влияние на темпы роста экономики России и ее экономическую безопасность. Power semiconductor devices (PSD) are basic components for the electric power converting electronics and pulsed technology, for the most important branches of the Russian economy. The state-of-the-art in the development and production of PSD has a significant impact on the growth rate of the economy of Russia and its economic security.


Author(s):  
T. A. Welton

Various authors have emphasized the spatial information resident in an electron micrograph taken with adequately coherent radiation. In view of the completion of at least one such instrument, this opportunity is taken to summarize the state of the art of processing such micrographs. We use the usual symbols for the aberration coefficients, and supplement these with £ and 6 for the transverse coherence length and the fractional energy spread respectively. He also assume a weak, biologically interesting sample, with principal interest lying in the molecular skeleton remaining after obvious hydrogen loss and other radiation damage has occurred.


2003 ◽  
Vol 48 (6) ◽  
pp. 826-829 ◽  
Author(s):  
Eric Amsel
Keyword(s):  

1968 ◽  
Vol 13 (9) ◽  
pp. 479-480
Author(s):  
LEWIS PETRINOVICH
Keyword(s):  

1984 ◽  
Vol 29 (5) ◽  
pp. 426-428
Author(s):  
Anthony R. D'Augelli

1991 ◽  
Vol 36 (2) ◽  
pp. 140-140
Author(s):  
John A. Corson
Keyword(s):  

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