scholarly journals In-situ TEM Investigation of the Amorphous to Crystalline Phase Change During Electrical Breakdown of Highly Conductive Polymers at the Atomic Scale

2020 ◽  
Vol 26 (S2) ◽  
pp. 3198-3200
Author(s):  
Michele Conroy ◽  
Kalani Moore ◽  
Rob Lehane ◽  
Alonso Gamero-Quijano ◽  
Micheal Scanlon ◽  
...  
Keyword(s):  
Phase Change ◽  
Crystalline Phase ◽  
Conductive Polymers ◽  
Electrical Breakdown ◽  
Atomic Scale ◽  
In Situ Tem

scholarly journals An In situ TEM study of the surface oxidation of palladium nanocrystals assisted by electron irradiation

Nanoscale ◽  
2017 ◽  
Vol 9 (19) ◽  
pp. 6327-6333 ◽  
Author(s):  
Dejiong Zhang ◽  
Chuanhong Jin ◽  
He Tian ◽  
Yalin Xiong ◽  
Hui Zhang ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Surface Oxidation ◽  
Atomic Scale ◽  
In Situ Tem

An In situ atomic scale study of the surface oxidation of Pd nanocrystals.

Atomic-scale quasi in-situ TEM observation on the redistribution of alloying element Cu in a B4C/Al composite at the initial stage of corrosion

2020 ◽  
Vol 174 ◽  
pp. 108808 ◽  
Author(s):  
Y.T. Zhou ◽  
Y.N. Zan ◽  
Q.Z. Wang ◽  
B.L. Xiao ◽  
Z.Y. Ma ◽  
...  
Keyword(s):  
Atomic Scale ◽  
In Situ Tem ◽  
Alloying Element ◽  
Initial Stage ◽  
Al Composite

In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device

2017 ◽  
Vol 24 (4) ◽  
pp. 2045-2049 ◽  
Author(s):  
Xiao Zhang ◽  
Yang Yang ◽  
Fangfang Xu ◽  
Tie Li ◽  
Yuelin Wang
Keyword(s):  
Mechanical Characterization ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Mems Device

Nanomeasurements of individual carbon nanotubes by in situ TEM

2000 ◽  
Vol 72 (1-2) ◽  
pp. 209-219 ◽  
Author(s):  
Z. L. Wang ◽  
P. Poncharal ◽  
W. A. de Heer
Keyword(s):  
Carbon Nanotubes ◽  
Complete Characterization ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Mechanical And Electrical Properties ◽  
Novel Approach ◽  
Transmission Electron ◽  
Electron Field

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanotube-like structures by in situ transmission electron microscopy (TEM). The technique is powerful in a way that it can be directly correlated to the atomic-scale microstructure of the carbon nanotube with its physical properties, thus providing a complete characterization of the nanotube. Applications of the technique will be demonstrated in measurements of the mechanical properties, the electron field emission, and the ballistic quantum conductance of individual carbon nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f = 10-15 ).

scholarly journals In situ TEM observation of void formation and migration in phase change memory devices with confined nanoscale Ge2Sb2Te5

2020 ◽  
Vol 2 (9) ◽  
pp. 3841-3848
Author(s):  
Sang Ho Oh ◽  
Kyungjoon Baek ◽  
Sung Kyu Son ◽  
Kyung Song ◽  
Jang Won Oh ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Void Formation ◽  
In Situ Tem ◽  
Memory Devices ◽  
Device Failure ◽  
And Migration ◽  
Change Memory

Void formation and migration that drive the device failure of Ge2Sb2Te5 (GST)-based practical devices were revealed via in situ TEM.

In-situ Characterization of Switching Mechanism in Phase Change Random Access Memory (PRAM) Using Transmission Electron Microscopy (TEM)

2013 ◽  
Author(s):  
Sungkyu Son ◽  
Seungjoon Jeon ◽  
Jangwon Oh ◽  
Won Kim ◽  
Hojoung Kim ◽  
...  
Keyword(s):  
Phase Transition ◽  
Failure Analysis ◽  
Phase Change ◽  
Void Formation ◽  
Amorphous State ◽  
Random Access ◽  
Switching Behavior ◽  
In Situ Tem ◽  
Switching Mechanism

Abstract It is important to understand the switching mechanism of phase change material for failure analysis of PRAM device. In this study, the real time observations of phase transition and void formation mechanism of confined GST structure were investigated using in-situ TEM with multi-pulse AC biasing technique. In-situ SET switching behavior between amorphous state and crystalline state with continuous structural change was successfully observed. Volume shrink of GST, due to the phase transition, induced voids at grain boundary of crystalline phase. Excess Joule-heating after crystallization caused coalescence and migration of voids. These results may give us a crucial clue for endurance failure analysis of PRAM.

In situ TEM observations of irradiation-induced phase change in tungsten

2009 ◽  
Vol 44 (8) ◽  
pp. 1965-1968 ◽  
Author(s):  
C. L. Chen ◽  
T. Nagase ◽  
H. Mori
Keyword(s):  
Phase Change ◽  
In Situ Tem
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