scholarly journals Secondary Ion Mass Spectrometry for Mg Isotope Ratio Measurements: Application to Meteoritic Chondrules and Cometary Particles

2020 ◽  
Vol 26 (S2) ◽  
pp. 3204-3206
Author(s):  
Noriko Kita ◽  
Kohei Fukuda ◽  
Guillaume Siron
Keyword(s):  
Mass Spectrometry ◽  
Isotope Ratio ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Isotope Ratio Measurements

scholarly journals SIMS Lab Potsdam: Secondary Ion Mass Spectrometry Laboratory Potsdam

2016 ◽  
Vol 2 ◽  
Author(s):  
Michael Wiedenbeck ◽  
Alexander Rocholl ◽  
Robert Trumbull ◽  
Frédéric Couffignal
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Isotope Ratio ◽  
Secondary Ion Mass Spectrometry ◽  
Research Centre ◽  
Ratio Data ◽  
German Research ◽  
Ion Mass Spectrometry ◽  
User Facility ◽  
Secondary Ion

Secondary Ion Mass Spectrometry (SIMS) is among the most powerful laboratory tools available to the analytical geochemist. Its strength lies in SIMS’ ability to produce high precision trace element and isotope ratio data on sample masses as small as 100 picograms. The Helmholtz-Centre Potsdam GFZ German Research Centre for Geosciences operates a fully equipped, large geometry SIMS instrument, which is supported by a comprehensive spectrum of peripheral instrumentation. This facility operates as an open user facility which supports the needs of the global geochemical community.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Sign in / Sign up

Export Citation Format

Share Document