Efficient Isotope Ratio Analysis of Uranium Particles in Swipe Samples by Total-Reflection X-ray Fluorescence Spectrometry and Secondary Ion Mass Spectrometry

2004 ◽  
Vol 41 (11) ◽  
pp. 1027-1032 ◽  
Author(s):  
Fumitaka ESAKA ◽  
Kazuo WATANABE ◽  
Hiroyasu FUKUYAMA ◽  
Takashi ONODERA ◽  
Konomi T. ESAKA ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Isotope Ratio ◽  
Secondary Ion Mass Spectrometry ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
Ratio Analysis ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Isotope Ratio Analysis ◽  
Secondary Ion

Chemical state and isotope ratio analysis of individual uranium particles by a combination of micro-Raman spectroscopy and secondary ion mass spectrometry

2017 ◽  
Vol 9 (44) ◽  
pp. 6261-6266 ◽  
Author(s):  
T. Yomogida ◽  
F. Esaka ◽  
M. Magara
Keyword(s):  
Mass Spectrometry ◽  
Raman Spectroscopy ◽  
Analytical Procedure ◽  
Secondary Ion Mass Spectrometry ◽  
Ratio Analysis ◽  
Micro Raman Spectroscopy ◽  
Ion Mass Spectrometry ◽  
Chemical States ◽  
Isotope Ratio Analysis ◽  
Secondary Ion

An analytical procedure using micro-Raman spectroscopy (MRS) and secondary ion mass spectrometry (SIMS) was developed to elucidate both the chemical states and isotope ratios of individual micron-sized uranium particles.

scholarly journals A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

2021 ◽  
Author(s):  
Lluís Yedra ◽  
C. N. Shyam Kumar ◽  
Alisa Pshenova ◽  
Esther Lentzen ◽  
Patrick Philipp ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Energy Dispersive ◽  
New Method ◽  
X Ray ◽  
Edx Analysis ◽  
Ion Mass Spectrometry ◽  
Trace Concentrations ◽  
Secondary Ion

The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.

Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

2014 ◽  
Vol 59 (2) ◽  
pp. 173-180 ◽  
Author(s):  
Bianca Kyriacou ◽  
Katie L. Moore ◽  
David Paterson ◽  
Martin D. de Jonge ◽  
Daryl L. Howard ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Fluorescence Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Rice Grain ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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