A Potential New Chalcopyrite Reference Material for Secondary Ion Mass Spectrometry Sulfur Isotope Ratio Analysis

2020 ◽  
Vol 44 (3) ◽  
pp. 485-500
Author(s):  
Rucao Li ◽  
Xiao‐Ping Xia ◽  
Huayong Chen ◽  
Nanping Wu ◽  
Taiping Zhao ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Reference Material ◽  
Isotope Ratio ◽  
Sulfur Isotope ◽  
Secondary Ion Mass Spectrometry ◽  
Ratio Analysis ◽  
Ion Mass Spectrometry ◽  
Isotope Ratio Analysis ◽  
Secondary Ion

Chemical state and isotope ratio analysis of individual uranium particles by a combination of micro-Raman spectroscopy and secondary ion mass spectrometry

2017 ◽  
Vol 9 (44) ◽  
pp. 6261-6266 ◽  
Author(s):  
T. Yomogida ◽  
F. Esaka ◽  
M. Magara
Keyword(s):  
Mass Spectrometry ◽  
Raman Spectroscopy ◽  
Analytical Procedure ◽  
Secondary Ion Mass Spectrometry ◽  
Ratio Analysis ◽  
Micro Raman Spectroscopy ◽  
Ion Mass Spectrometry ◽  
Chemical States ◽  
Isotope Ratio Analysis ◽  
Secondary Ion

An analytical procedure using micro-Raman spectroscopy (MRS) and secondary ion mass spectrometry (SIMS) was developed to elucidate both the chemical states and isotope ratios of individual micron-sized uranium particles.

Sulfur Isotope Studies in Solid Organics: A Protocol for Utilizing Heterogeneous Standards and Secondary Ion Mass Spectrometry

2014 ◽  
Vol 28 (4) ◽  
pp. 2446-2453 ◽  
Author(s):  
Hubert E. King ◽  
Mindy M. Zimmer ◽  
William C. Horn ◽  
William A. Lamberti ◽  
Firdaus Janoos
Keyword(s):  
Mass Spectrometry ◽  
Sulfur Isotope ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Isotope Studies ◽  
Secondary Ion

scholarly journals SIMS Lab Potsdam: Secondary Ion Mass Spectrometry Laboratory Potsdam

2016 ◽  
Vol 2 ◽  
Author(s):  
Michael Wiedenbeck ◽  
Alexander Rocholl ◽  
Robert Trumbull ◽  
Frédéric Couffignal
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Isotope Ratio ◽  
Secondary Ion Mass Spectrometry ◽  
Research Centre ◽  
Ratio Data ◽  
German Research ◽  
Ion Mass Spectrometry ◽  
User Facility ◽  
Secondary Ion

Secondary Ion Mass Spectrometry (SIMS) is among the most powerful laboratory tools available to the analytical geochemist. Its strength lies in SIMS’ ability to produce high precision trace element and isotope ratio data on sample masses as small as 100 picograms. The Helmholtz-Centre Potsdam GFZ German Research Centre for Geosciences operates a fully equipped, large geometry SIMS instrument, which is supported by a comprehensive spectrum of peripheral instrumentation. This facility operates as an open user facility which supports the needs of the global geochemical community.

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