scholarly journals Semi-Quantitative Analysis of Iron Nodules in Equilibrium Refining Catalysts by Artificial Intelligence-Augmented Scanning Electron Microscopy

2021 ◽  
Vol 27 (S1) ◽  
pp. 1804-1805
Author(s):  
Ke-Bin Low ◽  
Jian Shi ◽  
Melissa Clough Mastry ◽  
Vasileios Komvokis ◽  
Bilge Yilmaz
Keyword(s):  
Artificial Intelligence ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Quantitative Analysis ◽  
Scanning Electron

Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence

1983 ◽  
Vol 16 (6) ◽  
pp. 606-610 ◽  
Author(s):  
S. Weissmann ◽  
V. A. Greenhut ◽  
J. Chaudhuri ◽  
Z. H. Kalman
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Quantitative Analysis ◽  
Strain Distribution ◽  
Elastic Strain ◽  
Metal Film ◽  
Silicon Plate ◽  
X Ray ◽  
Scanning Electron

A method is presented for enhancing the fluorescence of the silver precipitates in the microfluorescent analysis of X-ray topographs by scanning electron microscopy or similar electron microprobes. The method is based on the indirect excitation of the silver fluorescence by depositing a thin suitable metal film on the emulsion of a nuclear track plate. Theoretical aspects of the method are presented and experimentally verified. The method was applied to determine the elastic strain distribution in a bent silicon plate containing a hole by measuring the opacities of the exposed and developed topograph obtained from the specimen.

scholarly journals Quantitative analysis of {332}〈113〉 twinning in a Ti-15Mo alloy by in situ scanning electron microscopy

2018 ◽  
Vol 19 (1) ◽  
pp. 474-483 ◽  
Author(s):  
Ivan Gutierrez-Urrutia ◽  
Cheng-Lin Li ◽  
Xin Ji ◽  
Satoshi Emura ◽  
Koichi Tsuchiya
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Quantitative Analysis ◽  
Scanning Electron

Correlative Fractography: Combining Scanning Electron Microscopy and Light Microscopes for Qualitative and Quantitative Analysis of Fracture Surfaces

2013 ◽  
Vol 19 (2) ◽  
pp. 496-500 ◽  
Author(s):  
Luis Rogerio de Oliveira Hein ◽  
José Alberto de Oliveira ◽  
Kamila Amato de Campos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Quantitative Analysis ◽  
New Method ◽  
Fracture Mechanisms ◽  
Stereo Pair ◽  
Qualitative And Quantitative Analysis ◽  
Qualitative And Quantitative ◽  
Fracture Surfaces ◽  
Scanning Electron

AbstractCorrelative fractography is a new expression proposed here to describe a new method for the association between scanning electron microscopy (SEM) and light microscopy (LM) for the qualitative and quantitative analysis of fracture surfaces. This article presents a new method involving the fusion of one elevation map obtained by extended depth from focus reconstruction from LM with exactly the same area by SEM and associated techniques, as X-ray mapping. The true topographic information is perfectly associated to local fracture mechanisms with this new technique, presented here as an alternative to stereo-pair reconstruction for the investigation of fractured components. The great advantage of this technique resides in the possibility of combining any imaging methods associated with LM and SEM for the same observed field from fracture surface.

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