scholarly journals Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods

2021 ◽  
pp. 1-11
Author(s):  
Baptiste Gault ◽  
Benjamin Klaes ◽  
Felipe F. Morgado ◽  
Christoph Freysoldt ◽  
Yue Li ◽  
...  

Atom probe tomography (APT) is often introduced as providing “atomic-scale” mapping of the composition of materials and as such is often exploited to analyze atomic neighborhoods within a material. Yet quantifying the actual spatial performance of the technique in a general case remains challenging, as it depends on the material system being investigated as well as on the specimen's geometry. Here, by using comparisons with field-ion microscopy experiments, field-ion imaging and field evaporation simulations, we provide the basis for a critical reflection on the spatial performance of APT in the analysis of pure metals, low alloyed systems and concentrated solid solutions (i.e., akin to high-entropy alloys). The spatial resolution imposes strong limitations on the possible interpretation of measured atomic neighborhoods, and directional neighborhood analyses restricted to the depth are expected to be more robust. We hope this work gets the community to reflect on its practices, in the same way, it got us to reflect on our work.

2013 ◽  
Vol 61 (12) ◽  
pp. 4696-4706 ◽  
Author(s):  
K.G. Pradeep ◽  
N. Wanderka ◽  
P. Choi ◽  
J. Banhart ◽  
B.S. Murty ◽  
...  

2018 ◽  
Vol 24 (4) ◽  
pp. 342-349 ◽  
Author(s):  
Ingrid McCarroll ◽  
Barbara Scherrer ◽  
Peter Felfer ◽  
Michael P. Moody ◽  
Julie M. Cairney

AbstractUnderstanding oxide–metal interfaces is crucial to the advancement of materials and components for many industries, most notably for semiconductor devices and power generation. Atom probe tomography provides three-dimensional, atomic scale information about chemical composition, making it an excellent technique for interface analysis. However, difficulties arise when analyzing interfacial regions due to trajectory aberrations, such as local magnification, and reconstruction artifacts. Correlative microscopy and field simulation techniques have revealed that nonuniform evolution of the tip geometry, caused by heterogeneous field evaporation, is partly responsible for these artifacts. Here we attempt to understand these trajectory artifacts through a study of the local evaporation field conditions. With a better understanding of the local evaporation field, it may be possible to account for some of the local magnification effects during the reconstruction process, eliminating these artifacts before data analysis.


2016 ◽  
Vol 22 (S3) ◽  
pp. 1534-1535
Author(s):  
Isabelle Martin ◽  
Robert Estivill ◽  
Marc Juhel ◽  
Adeline Grenier ◽  
Ty J. Prosa ◽  
...  

2010 ◽  
Vol 654-656 ◽  
pp. 2366-2369 ◽  
Author(s):  
Feng Zai Tang ◽  
Talukder Alam ◽  
Michael P. Moody ◽  
Baptiste Gault ◽  
Julie M. Cairney

Atom probe tomography provides compositional information in three dimensions at the atomic scale, and is therefore extremely suited to the study of nanocrystalline materials. In this paper we present atom probe results from the investigation of nanocomposite TiSi¬Nx coatings and nanocrystalline Al. We address some of the major challenges associated with the study of nanocrystalline materials, including specimen preparation, visualisation, common artefacts in the data and approaches to quantitative analysis. We also discuss the potential for the technique to relate crystallographic information to the compositional maps.


2015 ◽  
Vol 21 (S3) ◽  
pp. 1315-1316 ◽  
Author(s):  
Mukesh Bachhav ◽  
Yan Dong ◽  
Philip Skemer ◽  
Emmanuelle A. Marquis

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