scholarly journals Atomic Scale Investigation of Orthopyroxene and Olivine Grain Boundaries by Atom Probe Tomography

2015 ◽  
Vol 21 (S3) ◽  
pp. 1315-1316 ◽  
Author(s):  
Mukesh Bachhav ◽  
Yan Dong ◽  
Philip Skemer ◽  
Emmanuelle A. Marquis
Keyword(s):  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale

scholarly journals Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography

2020 ◽  
Vol 26 (2) ◽  
pp. 247-257 ◽  
Author(s):  
Benjamin M. Jenkins ◽  
Frédéric Danoix ◽  
Mohamed Gouné ◽  
Paul A.J. Bagot ◽  
Zirong Peng ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Specimen Preparation ◽  
Structure Property ◽  
Wide Range

AbstractInterfaces play critical roles in materials and are usually both structurally and compositionally complex microstructural features. The precise characterization of their nature in three-dimensions at the atomic scale is one of the grand challenges for microscopy and microanalysis, as this information is crucial to establish structure–property relationships. Atom probe tomography is well suited to analyzing the chemistry of interfaces at the nanoscale. However, optimizing such microanalysis of interfaces requires great care in the implementation across all aspects of the technique from specimen preparation to data analysis and ultimately the interpretation of this information. This article provides critical perspectives on key aspects pertaining to spatial resolution limits and the issues with the compositional analysis that can limit the quantification of interface measurements. Here, we use the example of grain boundaries in steels; however, the results are applicable for the characterization of grain boundaries and transformation interfaces in a very wide range of industrially relevant engineering materials.

scholarly journals Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography

2016 ◽  
Vol 22 (S3) ◽  
pp. 1534-1535
Author(s):  
Isabelle Martin ◽  
Robert Estivill ◽  
Marc Juhel ◽  
Adeline Grenier ◽  
Ty J. Prosa ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Scale Analysis

Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

2010 ◽  
Vol 654-656 ◽  
pp. 2366-2369 ◽  
Author(s):  
Feng Zai Tang ◽  
Talukder Alam ◽  
Michael P. Moody ◽  
Baptiste Gault ◽  
Julie M. Cairney
Keyword(s):  
Quantitative Analysis ◽  
Atom Probe Tomography ◽  
Nanocrystalline Materials ◽  
Atom Probe ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Specimen Preparation ◽  
Compositional Information

Atom probe tomography provides compositional information in three dimensions at the atomic scale, and is therefore extremely suited to the study of nanocrystalline materials. In this paper we present atom probe results from the investigation of nanocomposite TiSi¬Nx coatings and nanocrystalline Al. We address some of the major challenges associated with the study of nanocrystalline materials, including specimen preparation, visualisation, common artefacts in the data and approaches to quantitative analysis. We also discuss the potential for the technique to relate crystallographic information to the compositional maps.

scholarly journals Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations

2018 ◽  
Vol 33 (23) ◽  
pp. 4018-4030 ◽  
Author(s):  
Baptiste Gault ◽  
Andrew J. Breen ◽  
Yanhong Chang ◽  
Junyang He ◽  
Eric A. Jägle ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Image Position

Abstract

scholarly journals A near atomic-scale view at the composition of amyloid-beta fibrils by atom probe tomography

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Kristiane A. K. Rusitzka ◽  
Leigh T. Stephenson ◽  
Agnieszka Szczepaniak ◽  
Lothar Gremer ◽  
Dierk Raabe ◽  
...  
Keyword(s):  
Amyloid Beta ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale

scholarly journals Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography

2013 ◽  
Vol 19 (S2) ◽  
pp. 940-941 ◽  
Author(s):  
M. Bachhav ◽  
Y. Chen ◽  
E. Marquis ◽  
B. Geiser
Keyword(s):  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Chemical Segregation

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Examinations of Oxidation and Sulfidation of Grain Boundaries in Alloy 600 Exposed to Simulated Pressurized Water Reactor Primary Water

2013 ◽  
Vol 19 (3) ◽  
pp. 676-687 ◽  
Author(s):  
D.K. Schreiber ◽  
M.J. Olszta ◽  
D.W. Saxey ◽  
K. Kruska ◽  
K.L. Moore ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Alloy 600 ◽  
Pressurized Water Reactor ◽  
Intergranular Attack ◽  
Pressurized Water ◽  
Primary Water

AbstractHigh-resolution characterizations of intergranular attack in alloy 600 (Ni-17Cr-9Fe) exposed to 325°C simulated pressurized water reactor primary water have been conducted using a combination of scanning electron microscopy, NanoSIMS, analytical transmission electron microscopy, and atom probe tomography. The intergranular attack exhibited a two-stage microstructure that consisted of continuous corrosion/oxidation to a depth of ~200 nm from the surface followed by discrete Cr-rich sulfides to a further depth of ~500 nm. The continuous oxidation region contained primarily nanocrystalline MO-structure oxide particles and ended at Ni-rich, Cr-depleted grain boundaries with spaced CrS precipitates. Three-dimensional characterization of the sulfidized region using site-specific atom probe tomography revealed extraordinary grain boundary composition changes, including total depletion of Cr across a several nm wide dealloyed zone as a result of grain boundary migration.

Atom-probe tomography of surface oxides and oxidized grain boundaries in alloys from nuclear reactors

2013 ◽  
Vol 1514 ◽  
pp. 107-118 ◽  
Author(s):  
Karen Kruska ◽  
David W Saxey ◽  
Takumi Terachi ◽  
Takuyo Yamada ◽  
Peter Chou ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Nuclear Reactors ◽  
Bulk Material ◽  
Chemical Characterization ◽  
Atom Probe ◽  
Aqueous Environment ◽  
Pressurized Water ◽  
Surface Oxides

ABSTRACTThe preparation of site-specific atom-probe tomography (APT) samples containing localized features has become possible with the use of focused ion beams (FIBs). This technique was used to achieve the analysis of surface oxides and oxidized grain boundaries in this paper. Transmission electron microscopy (TEM), providing microstructural and chemical characterization of the same features, has also been used, revealing crucial additional information.The study of grain boundary oxidation in stainless steels and nickel-based alloys is required in order to understand the mechanisms controlling stress corrosion cracking in nuclear reactors. Samples oxidized under simulated pressurized water reactor primary water conditions were used, and FIB lift-out TEM and APT specimens containing the same oxidized grain boundary were prepared and fully characterized. The results from both techniques were found fully consistent and complementary.Chromium-rich spinel oxides grew at the surface and into the bulk material, along grain boundaries. Nickel was rejected from the oxides and accumulated ahead of the oxidation front. Lithium, which was present in small quantities in the aqueous environment during oxidation, was incorporated in the oxide. All phases were accurately quantified and the effect of different experimental parameters were analysed.

scholarly journals Atom Probe Tomography for Catalysis Applications: A Review

2019 ◽  
Vol 9 (13) ◽  
pp. 2721 ◽  
Author(s):  
Cédric Barroo ◽  
Austin J. Akey ◽  
David C. Bell
Keyword(s):  
Sample Preparation ◽  
Atom Probe Tomography ◽  
Ion Beam ◽  
3D Structure ◽  
Atom Probe ◽  
Atomic Scale ◽  
High Mass ◽  
Preparation Methods ◽  
Catalytic Materials ◽  
Sample Preparation Methods

Atom probe tomography is a well-established analytical instrument for imaging the 3D structure and composition of materials with high mass resolution, sub-nanometer spatial resolution and ppm elemental sensitivity. Thanks to recent hardware developments in Atom Probe Tomography (APT), combined with progress on site-specific focused ion beam (FIB)-based sample preparation methods and improved data treatment software, complex materials can now be routinely investigated. From model samples to complex, usable porous structures, there is currently a growing interest in the analysis of catalytic materials. APT is able to probe the end state of atomic-scale processes, providing information needed to improve the synthesis of catalysts and to unravel structure/composition/reactivity relationships. This review focuses on the study of catalytic materials with increasing complexity (tip-sample, unsupported and supported nanoparticles, powders, self-supported catalysts and zeolites), as well as sample preparation methods developed to obtain suitable specimens for APT experiments.

Sign in / Sign up

Export Citation Format

Share Document