Molecular secondary ion mass spectrometry with a liquid metal ion primary source

1983 ◽  
Vol 55 (8) ◽  
pp. 1318-1323 ◽  
Author(s):  
Douglas F. Barofsky ◽  
Ulrich. Giessmann ◽  
Anthony E. Bell ◽  
Lynwood W. Swanson
Keyword(s):  
Mass Spectrometry ◽  
Liquid Metal ◽  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Primary Source ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Cesium liquid metal ion source for secondary ion mass spectrometry

1994 ◽  
Vol 65 (7) ◽  
pp. 2276-2280 ◽  
Author(s):  
Kaoru Umemura ◽  
Hiroyasu Shichi ◽  
Setsuo Nomura
Keyword(s):  
Mass Spectrometry ◽  
Liquid Metal ◽  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Source ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Negative metal‐ion source for secondary‐ion mass spectrometry

1993 ◽  
Vol 64 (5) ◽  
pp. 1146-1149 ◽  
Author(s):  
Hisayoshi Yurimoto ◽  
Yoshiharu Mori ◽  
Hironori Yamamoto
Keyword(s):  
Mass Spectrometry ◽  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Source ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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