Identification of microelectrolysis products by diffuse reflectance infrared Fourier transform spectrometry

1985 ◽  
Vol 57 (1) ◽  
pp. 100-103 ◽  
Author(s):  
Hung Yuan. Cheng ◽  
Gary E. Zuber
Keyword(s):  
Fourier Transform ◽  
Diffuse Reflectance ◽  
Fourier Transform Spectrometry ◽  
Diffuse Reflectance Infrared

Determination of Silicon Dioxide in Silicon Carbide by Diffuse Reflectance Infrared Fourier Transform Spectrometry

1986 ◽  
Vol 40 (3) ◽  
pp. 310-313 ◽  
Author(s):  
Akira Tsuge ◽  
Yoshinori Uwamino ◽  
Toshio Ishizuka
Keyword(s):  
Fourier Transform ◽  
Silicon Dioxide ◽  
Diffuse Reflectance ◽  
Peak Height ◽  
Particle Sizes ◽  
Fourier Transform Spectrometry ◽  
Peak Intensity ◽  
Analytical Curve ◽  
Diffuse Reflectance Infrared

Diffuse reflectance infrared Fourier transform spectrometry was applied to the determination of SiO2 in SiC powders. The main peaks of SiO2 were observed in the 1000–1250 cm−1 region. The peak intensities were estimated from the peak height at 1150 cm−1. The intensities were little affected by the particle sizes of SiC powders in the 1–9–μm region. The linear relationship between peak intensity and concentration was obtained in the concentration range of 0–5 wt% SiO2. The analytical curve was successfully used for the determination of SiO2 in a few commercial SiC powders.

Infrared Microsampling by Diffuse Reflectance Fourier Transform Spectrometry

1980 ◽  
Vol 34 (5) ◽  
pp. 533-539 ◽  
Author(s):  
Michael P. Fuller ◽  
Peter R. Griffiths
Keyword(s):  
Fourier Transform ◽  
Thin Layer ◽  
Diffuse Reflectance ◽  
Absorption Bands ◽  
Fourier Transform Spectrometry ◽  
Increased Sensitivity ◽  
Intense Absorption ◽  
Diffuse Reflectance Infrared ◽  
Layer Chromatography

It is shown that diffuse reflectance techniques enable increased sensitivity to be obtained for infrared microsampling compared with the use of KBr micropellets. When nonabsorbing matrices, such as KCl, are used, detection limits of less than 10 ng of samples are observed. Samples absorbed on graphitized substrates, which have a fairly strong general absorption but few intense absorption bands, may also be studied but at somewhat reduced sensitivity. Diffuse reflectance infrared Fourier transform spectrometry does not appear to be particularly useful for studying adsorbates on silica gel, which is not only a strong infrared absorber but also has a surface which is so active that small changes in the surface structure can change the spectrum significantly. Extraction of sample spots from thin layer chromatography plates followed by deposition onto KCl yields much better results than in situ measurements.

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