Quantitative Analysis of Powdery Sample by Diffuse Reflectance Infrared Fourier Transform Spectrometry: Determination of the α-Component in Silicon Nitride

1991 ◽  
Vol 45 (8) ◽  
pp. 1377-1380 ◽  
Author(s):  
Akira Tsuge ◽  
Yoshinori Uwamino ◽  
Toshio Ishizuka ◽  
Kazuo Suzuki
1986 ◽  
Vol 40 (3) ◽  
pp. 310-313 ◽  
Author(s):  
Akira Tsuge ◽  
Yoshinori Uwamino ◽  
Toshio Ishizuka

Diffuse reflectance infrared Fourier transform spectrometry was applied to the determination of SiO2 in SiC powders. The main peaks of SiO2 were observed in the 1000–1250 cm−1 region. The peak intensities were estimated from the peak height at 1150 cm−1. The intensities were little affected by the particle sizes of SiC powders in the 1–9–μm region. The linear relationship between peak intensity and concentration was obtained in the concentration range of 0–5 wt% SiO2. The analytical curve was successfully used for the determination of SiO2 in a few commercial SiC powders.


1997 ◽  
Vol 51 (11) ◽  
pp. 1730-1735
Author(s):  
Jimmy Bak ◽  
Bruno Kindl

An application of diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) has been demonstrated to be able to determine small concentrations, down to the 100-ppm level, of carbonates in powdery superconductor (SPC) precursor samples. The detection of carbonates in SPC precursor powders is important because of degradation effects on the electrical properties of the final product. Qualitative analysis carried out by DRIFTS shows that strontium carbonate (SrCO3) is the major carbonate present in a batch of SPC precursor powder. Two different calibration approaches are employed in order to determine the SrCO3 concentrations in the SPC powders. The concentrations found by the two methods are in good agreement.


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