Quantitative analysis of diazonaphthoquinones by thin-layer chromatographic/diffuse reflectance infrared Fourier-transform spectrometry

1989 ◽  
Vol 61 (6) ◽  
pp. 615-618 ◽  
Author(s):  
Bernard T. Beauchemin ◽  
Phyllis R. Brown
Keyword(s):  
Fourier Transform ◽  
Quantitative Analysis ◽  
Thin Layer ◽  
Diffuse Reflectance ◽  
Fourier Transform Spectrometry ◽  
Diffuse Reflectance Infrared

Infrared Microsampling by Diffuse Reflectance Fourier Transform Spectrometry

1980 ◽  
Vol 34 (5) ◽  
pp. 533-539 ◽  
Author(s):  
Michael P. Fuller ◽  
Peter R. Griffiths
Keyword(s):  
Fourier Transform ◽  
Thin Layer ◽  
Diffuse Reflectance ◽  
Absorption Bands ◽  
Fourier Transform Spectrometry ◽  
Increased Sensitivity ◽  
Intense Absorption ◽  
Diffuse Reflectance Infrared ◽  
Layer Chromatography

It is shown that diffuse reflectance techniques enable increased sensitivity to be obtained for infrared microsampling compared with the use of KBr micropellets. When nonabsorbing matrices, such as KCl, are used, detection limits of less than 10 ng of samples are observed. Samples absorbed on graphitized substrates, which have a fairly strong general absorption but few intense absorption bands, may also be studied but at somewhat reduced sensitivity. Diffuse reflectance infrared Fourier transform spectrometry does not appear to be particularly useful for studying adsorbates on silica gel, which is not only a strong infrared absorber but also has a surface which is so active that small changes in the surface structure can change the spectrum significantly. Extraction of sample spots from thin layer chromatography plates followed by deposition onto KCl yields much better results than in situ measurements.

Determination of Silicon Dioxide in Silicon Carbide by Diffuse Reflectance Infrared Fourier Transform Spectrometry

1986 ◽  
Vol 40 (3) ◽  
pp. 310-313 ◽  
Author(s):  
Akira Tsuge ◽  
Yoshinori Uwamino ◽  
Toshio Ishizuka
Keyword(s):  
Fourier Transform ◽  
Silicon Dioxide ◽  
Diffuse Reflectance ◽  
Peak Height ◽  
Particle Sizes ◽  
Fourier Transform Spectrometry ◽  
Peak Intensity ◽  
Analytical Curve ◽  
Diffuse Reflectance Infrared

Diffuse reflectance infrared Fourier transform spectrometry was applied to the determination of SiO2 in SiC powders. The main peaks of SiO2 were observed in the 1000–1250 cm−1 region. The peak intensities were estimated from the peak height at 1150 cm−1. The intensities were little affected by the particle sizes of SiC powders in the 1–9–μm region. The linear relationship between peak intensity and concentration was obtained in the concentration range of 0–5 wt% SiO2. The analytical curve was successfully used for the determination of SiO2 in a few commercial SiC powders.

Quantitative Measurements of Adsorbed Aminosilanes on Muscovite Mica Using Diffuse Reflectance Infrared Fourier Transform Spectroscopy

1989 ◽  
Vol 43 (7) ◽  
pp. 1240-1248 ◽  
Author(s):  
Lena Vågberg ◽  
Paul De Potocki ◽  
Per Stenius
Keyword(s):  
Fourier Transform ◽  
Quantitative Analysis ◽  
Ir Spectroscopy ◽  
Diffuse Reflectance ◽  
Adsorbed Layer ◽  
Quantitative Measurements ◽  
Muscovite Mica ◽  
Ft Ir ◽  
Diffuse Reflectance Infrared ◽  
Ft Ir Spectroscopy

A method for quantitative analysis of 3-aminopropyltriethoxysilane (γ-APS) and N-(N-vinylbenzyl-2-aminoethyl)-3-aminopropyltrimethoxy-silane hydrochloride (cationic vinylbenzyl silane, CVBS) on muscovite mica powder has been developed with the use of diffuse reflectance FT-IR spectroscopy. The adsorption isotherms determined by this method are reported. The results are compared with a previous study of the adsorption of aminosilanes by ESCA, and possible models of the adsorbed layer are discussed.

Quantitative Analysis of Mineral Powders by DRIFTS: Determination of SrCO3 in Superconductor Precursor Powders

1997 ◽  
Vol 51 (11) ◽  
pp. 1730-1735
Author(s):  
Jimmy Bak ◽  
Bruno Kindl
Keyword(s):  
Fourier Transform ◽  
Quantitative Analysis ◽  
Diffuse Reflectance ◽  
Strontium Carbonate ◽  
Precursor Powder ◽  
Diffuse Reflectance Infrared ◽  
Precursor Powders ◽  
Ppm Level ◽  
Good Agreement

An application of diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) has been demonstrated to be able to determine small concentrations, down to the 100-ppm level, of carbonates in powdery superconductor (SPC) precursor samples. The detection of carbonates in SPC precursor powders is important because of degradation effects on the electrical properties of the final product. Qualitative analysis carried out by DRIFTS shows that strontium carbonate (SrCO3) is the major carbonate present in a batch of SPC precursor powder. Two different calibration approaches are employed in order to determine the SrCO3 concentrations in the SPC powders. The concentrations found by the two methods are in good agreement.

Sign in / Sign up

Export Citation Format

Share Document