Characterization of the photothermal deflection densitometer

1985 ◽  
Vol 57 (7) ◽  
pp. 1359-1362 ◽  
Author(s):  
Konan. Peck ◽  
Fotios K. Fotiou ◽  
Michael D. Morris
2008 ◽  
pp. 385-385-8
Author(s):  
JA Abate ◽  
AW Schmid ◽  
MJ Guardalben ◽  
DJ Smith ◽  
SD Jacobs

1997 ◽  
Vol 12 (9) ◽  
pp. 2381-2387 ◽  
Author(s):  
Lanhua Wei ◽  
Grady S. White

A new methodology for mapping thermal diffusivity using a photothermal deflection method is introduced. Two case studies are made: fiber-reinforced composite structures and contact damage zones in alumina. In the former, characterization of thermal microstructural features is demonstrated; in the latter, microcrack density is quantified. Experimental data are analyzed and compared with literature results. Advantages and limitations of the technique are discussed.


1999 ◽  
Vol 85 (5) ◽  
pp. 2881-2887 ◽  
Author(s):  
M. Bertolotti ◽  
S. Ligia ◽  
G. Liakhou ◽  
R. Li Voti ◽  
S. Paoloni ◽  
...  

1993 ◽  
Vol 328 ◽  
Author(s):  
Michael B. Meinhardt ◽  
Paul A. Cahill ◽  
Carl H. Seager ◽  
Allyson J. Beuhler ◽  
David A. Wargowski

ABSTRACTPreparation and characterization of novel dye-doped polyimide films for electrooptics is described. Thermal stabilities of donor-acceptor 2,5-diaryl oxazoles were evaluated by differential scanning calorimetry. Absorptive losses in thin films of Ultradel 9000D® doped with donor-acceptor oxazoles were measured by photothermal deflection spectroscopy. Absorptive losses at high doping levels may be explainable by dye-dye aggregation or dye degradation during the curing process. Lower doping levels, however, show losses of ≤ 3.0 dB/cm at 830 nm and ≤ 2.4 dB/cm at 1320 nm.


2016 ◽  
Vol 325 ◽  
pp. 104-115 ◽  
Author(s):  
André Loges ◽  
Sabrina Herberger ◽  
Daniel Werner ◽  
Thomas Wetzel

2017 ◽  
Vol 139 (9) ◽  
Author(s):  
Taher Ghrib ◽  
Munirah Abdullah Almessiere ◽  
Amal Lafy Al-Otaibi ◽  
Sami Brini ◽  
Radhouane Chtourou

This work presents a simple method based on electrical and thermal properties of materials. It permits researchers, in the field of manufacturing and characterization of thin and thick films in solid state to take appropriate experimental conditions before the preparation process. The calculation of the thermal diffusion length, its comparison with thicknesses of the substrate, the thin layer deposited on the substrate, the use of photothermal deflection technique, and the Cahill's law permit to highlight the necessary conditions that allow researchers to manufacture samples with high thermoelectric power such as the required thickness, electric conductivity, and thermal conductivity.


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