Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy

2006 ◽  
Vol 78 (15) ◽  
pp. 5436-5442 ◽  
Author(s):  
Maurizio R. Gullo ◽  
Patrick L. T. M. Frederix ◽  
Terunobu Akiyama ◽  
Andreas Engel ◽  
Nico F. deRooij ◽  
...  
Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.


Nano Letters ◽  
2005 ◽  
Vol 5 (4) ◽  
pp. 639-643 ◽  
Author(s):  
David P. Burt ◽  
Neil R. Wilson ◽  
John M. R. Weaver ◽  
Phillip S. Dobson ◽  
Julie V. Macpherson

Sensors ◽  
2021 ◽  
Vol 21 (4) ◽  
pp. 1132 ◽  
Author(s):  
Rejane M. P. da Silva ◽  
Javier Izquierdo ◽  
Mariana X. Milagre ◽  
Abenchara M. Betancor-Abreu ◽  
Isolda Costa ◽  
...  

Amperometric and potentiometric probes were employed for the detection and characterization of reactive sites on the 2098-T351 Al-alloy (AA2098-T351) using scanning electrochemical microscopy (SECM). Firstly, the probe of concept was performed on a model Mg-Al galvanic pair system using SECM in the amperometric and potentiometric operation modes, in order to address the responsiveness of the probes for the characterization of this galvanic pair system. Next, these sensing probes were employed to characterize the 2098-T351 alloy surface immersed in a saline aqueous solution at ambient temperature. The distribution of reactive sites and the local pH changes associated with severe localized corrosion (SLC) on the alloy surface were imaged and subsequently studied. Higher hydrogen evolution, lower oxygen depletion and acidification occurred at the SLC sites developed on the 2098-T351 Al-alloy.


2013 ◽  
Vol 19 (S2) ◽  
pp. 46-47
Author(s):  
K.C. Morton ◽  
M.A. Derylo ◽  
A.E. Weber ◽  
L.A. Baker

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


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