Continuous Monoisopropyl Amine Manufacturing: Sustainable Process Design and Plantwide Control

2015 ◽  
Vol 54 (13) ◽  
pp. 3398-3411 ◽  
Author(s):  
Ojasvi ◽  
Nitin Kaistha
Keyword(s):  
Process Design ◽  
Plantwide Control

Energy Efficient Styrene Process: Design and Plantwide Control

2019 ◽  
Vol 58 (12) ◽  
pp. 4890-4905 ◽  
Author(s):  
Alexandre C. Dimian ◽  
Costin Sorin Bildea
Keyword(s):  
Process Design ◽  
Energy Efficient ◽  
Plantwide Control

Continuous diisobutylene manufacturing: Conceptual process design and plantwide control

2017 ◽  
Vol 97 ◽  
pp. 59-75 ◽  
Author(s):  
Shudodhan Singh Thakur ◽  
Ojasvi ◽  
Vivek Kumar ◽  
Nitin Kaistha
Keyword(s):  
Process Design ◽  
Conceptual Process Design ◽  
Plantwide Control

PLANTWIDE CONTROL STUDY OF A VINYL ACETATE MONOMER PROCESS DESIGN

2005 ◽  
Vol 192 (10) ◽  
pp. 1243-1257 ◽  
Author(s):  
Donald G. Olsen ◽  
William Y. Svrcek ◽  
Brent R. Young
Keyword(s):  
Vinyl Acetate ◽  
Process Design ◽  
Vinyl Acetate Monomer ◽  
Plantwide Control ◽  
Control Study

Formulation of Automated Process-Design Problems in CNC Systems

2020 ◽  
Vol 40 (6) ◽  
pp. 488-490
Author(s):  
S. Yu. Kalyakulin ◽  
V. V. Kuz’min ◽  
E. V. Mitin ◽  
S. P. Sul’din
Keyword(s):  
Process Design ◽  
Design Problems ◽  
Automated Process

A Case Study of Defects Due to Process-Design Interaction in Nano Scale Technology

2007 ◽  
Author(s):  
Hung-Sung Lin ◽  
Ying-Chin Hou ◽  
Juimei Fu ◽  
Mong-Sheng Wu ◽  
Vincent Huang ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Circuit Design ◽  
Process Design ◽  
Integrated Circuit ◽  
Photon Emission ◽  
Integrated Circuit Design ◽  
Nano Scale ◽  
Leakage Path ◽  
Related Defect

Abstract The difficulties in identifying the precise defect location and real leakage path is increasing as the integrated circuit design and process have become more and more complicated in nano scale technology node. Most of the defects causing chip leakage are detectable with only one of the FA (Failure Analysis) tools such as LCD (Liquid Crystal Detection) or PEM (Photon Emission Microscope). However, due to marginality of process-design interaction some defects are often not detectable with only one FA tool [1][2]. This paper present an example of an abnormal power consumption process-design interaction related defect which could only be detected with more advanced FA tools.

Sign in / Sign up

Export Citation Format

Share Document