New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer

Scanning Probe ◽

Layer By Layer ◽

3D Structures ◽

Probe Microscopy ◽

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

Vertical and lateral drift corrections of scanning probe microscopy images

10.1116/1.3360909 ◽

2010 ◽

Vol 28 (3) ◽

pp. C4E31-C4E38 ◽

Cited By ~ 53

Author(s):

P. Rahe ◽

R. Bechstein ◽

A. Kühnle

Keyword(s):

Scanning Probe ◽

Probe Microscopy ◽

Lateral Drift ◽

Non-linear registration of scanning probe microscopy images

Nanotechnology ◽

10.1088/0957-4484/17/3/044 ◽

2006 ◽

Vol 17 (3) ◽

pp. 881-887 ◽

Cited By ~ 9

Author(s):

S Scherdel ◽

S Wirtz ◽

N Rehse ◽

R Magerle

Keyword(s):

Scanning Probe ◽

Probe Microscopy ◽

Non Linear ◽

A computer program for automated step edge motion analysis from scanning probe microscopy images

Surface Science ◽

10.1016/j.susc.2009.02.020 ◽

2009 ◽

Vol 603 (7) ◽

pp. 1034-1040

Author(s):

Brittany D. Campbell ◽

Xiaoming Hu ◽

Steven R. Higgins

Keyword(s):

Computer Program ◽

Motion Analysis ◽

Step Edge ◽

Scanning Probe ◽

Probe Microscopy ◽

Erratum: Reconstruction of multi-frame semi-sparse scanning probe microscopy images using dependent Gaussian process (2020 Meas. Sci. Technol. 31 045013)

Measurement Science and Technology ◽

10.1088/1361-6501/ab7714 ◽

2020 ◽

Vol 31 (9) ◽

pp. 099501

Author(s):

Weiyan Zhou ◽

Mingjun Ren ◽

Limin Zhu

Keyword(s):

Gaussian Process ◽

Scanning Probe ◽

Probe Microscopy ◽

Pooling analysis of scanning probe microscopy images

Surface Science ◽

10.1016/s0039-6028(98)00114-9 ◽

1998 ◽

Vol 406 (1-3) ◽

pp. 206-220 ◽

Cited By ~ 9

Author(s):

P. Dooley ◽

S.L. Bernasek

Keyword(s):

Scanning Probe ◽

Probe Microscopy ◽

Enhanced feature analysis using wavelets for scanning probe microscopy images of surfaces

Journal of Colloid and Interface Science ◽

10.1016/j.jcis.2003.09.047 ◽

2004 ◽

Vol 272 (2) ◽

pp. 365-377 ◽

Cited By ~ 42

Author(s):

Alisher Maksumov ◽

Ruxandra Vidu ◽

Ahmet Palazoglu ◽

Pieter Stroeve

Keyword(s):

Scanning Probe ◽

Feature Analysis ◽

Probe Microscopy ◽

Nonlinear digital filtering of scanning‐probe‐microscopy images by morphological pseudoconvolutions

Journal of Applied Physics ◽

10.1063/1.351233 ◽

1992 ◽

Vol 71 (4) ◽

pp. 1565-1578 ◽

Cited By ~ 12

Author(s):

Andrew D. Weisman ◽

Edward R. Dougherty ◽

Howard A. Mizes ◽

R. J. Dwayne Miller

Keyword(s):

Digital Filtering ◽

Scanning Probe ◽

Probe Microscopy ◽

Contrast in scanning probe microscopy images of ultrathin insulator films

Applied Physics Letters ◽

10.1063/1.2172397 ◽

2006 ◽

Vol 88 (6) ◽

pp. 063107 ◽

Cited By ~ 5

Author(s):

Andreas Klust ◽

Qiuming Yu ◽

Marjorie A. Olmstead ◽

Taisuke Ohta ◽

Fumio S. Ohuchi ◽

...

Keyword(s):

Scanning Probe ◽

Probe Microscopy ◽

Defect identification and statistics toolbox: automated defect analysis for scanning probe microscopy images

Journal of Physics Condensed Matter ◽

10.1088/1361-648x/abc1b2 ◽

2020 ◽

Vol 33 (4) ◽

pp. 045901

Author(s):

Alana Gudinas ◽

Jason Moscatello ◽

Shawna M Hollen

Keyword(s):

Scanning Probe ◽

Defect Analysis ◽

Defect Identification ◽

Probe Microscopy ◽

Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping

Scanning ◽

10.1002/sca.4950250106 ◽

2006 ◽

Vol 25 (1) ◽

pp. 25-33 ◽

Cited By ~ 9

Author(s):

Matthew L. Trawick ◽

Mischa Megens ◽

Dan E. Angelescu ◽

Christopher Harrison ◽

Daniel A. Vega ◽

...

Keyword(s):

Scanning Probe ◽

Polynomial Mapping ◽

Probe Microscopy ◽