Probing the Surface Curie Temperature of Ferroelectric P(VDF-ran-TrFE) Copolymers by Argon Gas Cluster Ion Scattering

2022 ◽  
Author(s):  
Mykhailo Chundak ◽  
Claude Poleunis ◽  
Vincent Delmez ◽  
Alain M. Jonas ◽  
Arnaud Delcorte
Keyword(s):  
Curie Temperature ◽  
Ion Scattering ◽  
Argon Gas ◽  
Cluster Ion

Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis

2019 ◽  
Vol 40 (9) ◽  
pp. 877-881 ◽  
Author(s):  
Sang Ju Lee ◽  
Chang Min Choi ◽  
Boo Ki Min ◽  
Ji Young Baek ◽  
Jae Yeong Eo ◽  
...  
Keyword(s):  
Ion Beam ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion ◽  
Sims Analysis ◽  
Gas Cluster Ion Beam

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

2012 ◽  
Vol 116 (44) ◽  
pp. 23735-23741 ◽  
Author(s):  
Li Yang ◽  
Martin P. Seah ◽  
Ian S. Gilmore
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Sputtering Yields

XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam

2016 ◽  
Vol 11 (2) ◽  
pp. 029603 ◽  
Author(s):  
Paul M. Dietrich ◽  
Carolin Nietzold ◽  
Matthias Weise ◽  
Wolfgang E. S. Unger ◽  
Saad Alnabulsi ◽  
...  
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Argon Gas ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

scholarly journals Improved mass resolution and mass accuracy in TOF-SIMS spectra and images using argon gas cluster ion beams

2016 ◽  
Vol 11 (2) ◽  
pp. 02A321 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Sohee Yoon ◽  
Jeong Hee Moon ◽  
Tae Geol Lee
Keyword(s):  
Mass Accuracy ◽  
Ion Beams ◽  
Mass Resolution ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

2014 ◽  
Vol 46 (12-13) ◽  
pp. 1129-1132
Author(s):  
Makiko Fujii ◽  
Shunichirou Nakagawa ◽  
Toshio Seki ◽  
Takaaki Aoki ◽  
Jiro Matsuo
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Argon Gas ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion

Removal of Organic Contamination from Graphene with a Controllable Mass-Selected Argon Gas Cluster Ion Beam

2015 ◽  
Vol 119 (31) ◽  
pp. 17836-17841 ◽  
Author(s):  
Bonnie J. Tyler ◽  
Barry Brennan ◽  
Helena Stec ◽  
Trupti Patel ◽  
Ling Hao ◽  
...  
Keyword(s):  
Ion Beam ◽  
Organic Contamination ◽  
Argon Gas ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam
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