Defects Induced Charge Trapping/Detrapping and Hysteresis Phenomenon in MoS2 Field-Effect Transistors: Mechanism Revealed by Anharmonic Marcus Charge Transfer Theory
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2018 ◽
Vol 10
(4)
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pp. 4206-4212
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2000 ◽
Vol 134
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pp. 10-16
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Vol 138
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pp. 468-478
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Vol 112
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pp. 14579-14588
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