Correlative Super-Resolution and Atomic Force Microscopy of DNA Nanostructures and Characterization of Addressable Site Defects

ACS Nano ◽  
2021 ◽  
Author(s):  
Christopher M. Green ◽  
William L. Hughes ◽  
Elton Graugnard ◽  
Wan Kuang
Keyword(s):  
Atomic Force Microscopy ◽  
Super Resolution ◽  
Dna Nanostructures ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

scholarly journals Recent Progressive Use of Advanced Atomic Force Microscopy in Polymer Science: A Review

2020 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemin ◽  
Pascal Carriere ◽  
Aymen Amine Assadi ◽  
Dinh Duc Nguyen
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. In this perspective paper, we review recent progress in the use of AFM-IR in polymer science. We describe first the principle of AFM-IR and the recent improvements to enhance its resolution. We discuss then the last progress in the use of AFM-IR as a super-resolution correlated scanned-probe IR spectroscopy for chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers and biopolymers. To highlight the advantages of AFM-IR, we report here several results in studying crystallization of both miscible and immiscible blends as well as polymer aging. Then, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure and crystallization mechanisms at the nanoscale, which have never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa

Mechanical characterization of cellulose single nanofiber by atomic force microscopy

2017 ◽  
Author(s):  
Lindong Zhai ◽  
Jeong Woong Kim ◽  
Jiyun Lee ◽  
Jaehwan Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Mechanical Characterization ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Electron Emission from High Density Self-Aligned Si-Based Quantum Dots by Conducting-Probe Atomic Force Microscopy

2014 ◽  
Vol 64 (6) ◽  
pp. 923-928 ◽  
Author(s):  
D. Takeuchi ◽  
K. Makihara ◽  
A. Ohta ◽  
M. Ikeda ◽  
S. Miyazaki
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Electron Emission ◽  
High Density ◽  
Force Microscopy ◽  
Atomic Force

Characterization of mitochondria isolated from normal and ischemic hearts in rats utilizing atomic force microscopy

Micron ◽  
2011 ◽  
Vol 42 (3) ◽  
pp. 299-304 ◽  
Author(s):  
Gi-Ja Lee ◽  
Su-Jin Chae ◽  
Jae Hoon Jeong ◽  
So-Ra Lee ◽  
Sang-Jin Ha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document