Probing Transient Localized Electromagnetic Fields Using Low-Energy Point-Projection Electron Microscopy

ACS Photonics ◽  
2021 ◽  
Author(s):  
Germann Hergert ◽  
Andreas Wöste ◽  
Jan Vogelsang ◽  
Thomas Quenzel ◽  
Dong Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electromagnetic Fields ◽  
Low Energy ◽  
Energy Point ◽  
Point Projection

Low Energy Point Source Electron Microscopy

1992 ◽  
Vol 295 ◽  
Author(s):  
H. J. Kreuzer
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Point Source ◽  
Carbon Fibre ◽  
Double Helix ◽  
Low Energy ◽  
Small Cluster ◽  
Image Size ◽  
Energy Point ◽  
Low Energy Electron

AbstractThe theory of the point source low energy electron microscope is reviewed. Images are calculated for a carbon fibre, a small cluster of MgO and a double helix of carbon atoms. A Kirchoff-Helmholtz transform is used for reconstruction. The importance of image size is stressed and the chemical specificity of the method is demonstrated

LOW ENERGY POINT REFLECTION ELECTRON MICROSCOPY

1997 ◽  
Vol 04 (03) ◽  
pp. 577-587 ◽  
Author(s):  
J. C. H. SPENCE ◽  
X. ZHANG ◽  
U. WEIERSTALL ◽  
J. M. ZUO ◽  
E. MUNRO ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Low Energy ◽  
Energy Point ◽  
Point Reflection ◽  
Reflection Electron Microscopy

Brittle fracture of nickel by dynamic indentation

1992 ◽  
Vol 7 (8) ◽  
pp. 1973-1975 ◽  
Author(s):  
J.W. Hoehn ◽  
T. Foecke ◽  
W.W. Gerberich
Keyword(s):  
Electron Microscopy ◽  
Brittle Fracture ◽  
Fracture Process ◽  
Low Energy ◽  
Face Centered Cubic ◽  
Dynamic Indentation ◽  
Transgranular Cleavage ◽  
Energy Process ◽  
Face Centered ◽  
Scanning Electron

Cracks of up to 40 μm which are either transgranular cleavage or very low energy “ductile” cracks have been introduced into large-grained fcc Ni. The mechanism for introducing this brittle fracture was dynamic indentation. Optical and scanning electron microscopy together with use of selected area channeling patterns were used to confirm that the fracture process is transgranular. The results qualitatively support the hypothesis that dynamic cracks originating in a brittle film can propagate relatively large distances into a ductile face-centered-cubic substrate by a rapid, low energy process.

Interaction Between Basal Stacking Faults and Prismatic Inversion Domain Boundaries in GaN

2000 ◽  
Vol 639 ◽  
Author(s):  
Philomela Komninou ◽  
Joseph Kioseoglou ◽  
Eirini Sarigiannidou ◽  
George P. Dimitrakopulos ◽  
Thomas Kehagias ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Stacking Faults ◽  
High Resolution Electron Microscopy ◽  
High Energy ◽  
Low Energy ◽  
Inversion Domain ◽  
Resolution Electron ◽  
Domain Boundaries ◽  
Inversion Domain Boundaries

ABSTRACTThe interaction of growth intrinsic stacking faults with inversion domain boundaries in GaN epitaxial layers is studied by high resolution electron microscopy. It is observed that stacking faults may mediate a structural transformation of inversion domain boundaries, from the low energy types, known as IDB boundaries, to the high energy ones, known as Holt-type boundaries. Such interactions may be attributed to the different growth rates of adjacent domains of inverse polarity.

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