Analysis of the Limits of the Local Density of Photonic States near Nanostructures

ACS Photonics ◽  
2018 ◽  
Vol 5 (6) ◽  
pp. 2437-2445 ◽  
Author(s):  
Stephen Sanders ◽  
Alejandro Manjavacas
Nano Letters ◽  
2014 ◽  
Vol 14 (5) ◽  
pp. 2623-2627 ◽  
Author(s):  
Andreas W. Schell ◽  
Philip Engel ◽  
Julia F. M. Werra ◽  
Christian Wolff ◽  
Kurt Busch ◽  
...  

Author(s):  
Christian Bluma ◽  
Yanina Cesa ◽  
Johanna M. van den Broek ◽  
Allard P. Mosk ◽  
Willem L. Vos ◽  
...  

2009 ◽  
Vol 11 (14) ◽  
pp. 2525 ◽  
Author(s):  
Yanina Cesa ◽  
Christian Blum ◽  
Johanna M. van den Broek ◽  
Allard P. Mosk ◽  
Willem L. Vos ◽  
...  

2009 ◽  
Author(s):  
Christian Blum ◽  
Yanina Cesa ◽  
Johanna M. van den Broek ◽  
Allard P. Mosk ◽  
Willem L. Vos ◽  
...  

2001 ◽  
Vol 345 (5-6) ◽  
pp. 512-516 ◽  
Author(s):  
Gérard Colas des Francs ◽  
Christian Girard ◽  
Jean-Claude Weeber ◽  
Alain Dereux

2012 ◽  
Vol 21 (04) ◽  
pp. 1250048 ◽  
Author(s):  
AZARDOKHT MAZAHERI ◽  
HAMID REZA FALLAH ◽  
JAVAD ZARBAKHSH

The relation between position of optical source and excitation of photonic crystal cavity modes are investigated. For multimode cavities, the source position considerably affects the modes' excitation. The frequency distributions of local density of photonic states in a multimode cavity differ for source positions at structural symmetric locations and nonsymmetrical ones. It was also found that the geometry of cavity's neighboring layers has strong influence on the spatial and spectral distributions of modes. The results also show that the shifts of various cavity modes in frequency domain have different sensitivity with respect to geometrical tolerance. This can be used in various applications which need mode tuning.


Author(s):  
Xudong Weng ◽  
O.F. Sankey ◽  
Peter Rez

Single electron band structure techniques have been applied successfully to the interpretation of the near edge structures of metals and other materials. Among various band theories, the linear combination of atomic orbital (LCAO) method is especially simple and interpretable. The commonly used empirical LCAO method is mainly an interpolation method, where the energies and wave functions of atomic orbitals are adjusted in order to fit experimental or more accurately determined electron states. To achieve better accuracy, the size of calculation has to be expanded, for example, to include excited states and more-distant-neighboring atoms. This tends to sacrifice the simplicity and interpretability of the method.In this paper. we adopt an ab initio scheme which incorporates the conceptual advantage of the LCAO method with the accuracy of ab initio pseudopotential calculations. The so called pscudo-atomic-orbitals (PAO's), computed from a free atom within the local-density approximation and the pseudopotential approximation, are used as the basis of expansion, replacing the usually very large set of plane waves in the conventional pseudopotential method. These PAO's however, do not consist of a rigorously complete set of orthonormal states.


Author(s):  
Z. L. Wang ◽  
R. Kontra ◽  
A. Goyal ◽  
D. M. Kroeger ◽  
L.F. Allard

Previous studies of Y2BaCuO5/YBa2Cu3O7-δ(Y211/Y123) interfaces in melt-processed and quench-melt-growth processed YBa2Cu3O7-δ using high resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS) have revealed a high local density of stacking faults in Y123, near the Y211/Y123 interfaces. Calculations made using simple energy considerations suggested that these stacking faults may act as effective flux-pinners and may explain the observations of increased Jc with increasing volume fraction of Y211. The present paper is intended to determine the atomic structures of the observed defects. HRTEM imaging was performed using a Philips CM30 (300 kV) TEM with a point-to-point image resolution of 2.3 Å. Nano-probe EDS analysis was performed using a Philips EM400 TEM/STEM (100 kV) equipped with a field emission gun (FEG), which generated an electron probe of less than 20 Å in diameter.Stacking faults produced by excess single Cu-O layers: Figure 1 shows a HRTEM image of a Y123 film viewed along [100] (or [010]).


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