Growth of Silicon Carbide Nanowires by a Microwave Heating-Assisted Physical Vapor Transport Process Using Group VIII Metal Catalysts

2007 ◽  
Vol 19 (23) ◽  
pp. 5531-5537 ◽  
Author(s):  
Siddarth G. Sundaresan ◽  
Albert V. Davydov ◽  
Mark D. Vaudin ◽  
Igor Levin ◽  
James E. Maslar ◽  
...  
2019 ◽  
Vol 12 (03) ◽  
pp. 1950032 ◽  
Author(s):  
Yuchen Deng ◽  
Yaming Zhang ◽  
Nanlong Zhang ◽  
Qiang Zhi ◽  
Bo Wang ◽  
...  

Pure dense silicon carbide (SiC) ceramics were obtained via the high-temperature physical vapor transport (HTPVT) method using graphite paper as the growth substrate. The phase composition, the evolution of microstructure, the thermal diffusivity and thermal conductivity at RT to 200∘C were investigated. The obtained samples had a relative density of higher than 98.7% and a large grain size of 1[Formula: see text]mm, the samples also had a room-temperature thermal conductivity of [Formula: see text] and with the temperature increased to 200∘C, the thermal conductivity still maintained at [Formula: see text].


2004 ◽  
Vol 457-460 ◽  
pp. 55-58 ◽  
Author(s):  
Peter J. Wellmann ◽  
Z.G. Herro ◽  
Sakwe Aloysius Sakwe ◽  
Pierre M. Masri ◽  
M.V. Bogdanov ◽  
...  

1993 ◽  
Vol 78 (2) ◽  
pp. 211-226 ◽  
Author(s):  
Bernard Coq ◽  
François Figueras ◽  
Patrick Geneste ◽  
Claude Moreau ◽  
Patrice Moreau ◽  
...  

1987 ◽  
Vol 60 (5) ◽  
pp. 1721-1726 ◽  
Author(s):  
Jun-ichi Ishiyama ◽  
Satoshi Maeda ◽  
Kazuhiro Takahashi ◽  
Yasuhisa Senda ◽  
Shin Imaizumi

2013 ◽  
Vol 28 (11) ◽  
pp. 1248-1252 ◽  
Author(s):  
Yonggui Shi ◽  
Xinghua Yang ◽  
Dong Wang ◽  
Peng Zhang ◽  
Jincheng Zhang ◽  
...  

2008 ◽  
Vol 600-603 ◽  
pp. 301-304 ◽  
Author(s):  
Yi Chen ◽  
Ning Zhang ◽  
Xian Rong Huang ◽  
David R. Black ◽  
Michael Dudley

The density and sense distribution of elementary threading screw dislocations in a physical vapor transport grown 3-inch 4H silicon carbide wafer have been studied. The density of TSDs ranges between 1.6×103/cm2 and 7.1×103/cm2 and the lowest density is observed at positions approximately half radius off the wafer center. The dislocation sense of elementary threading screw dislocations can be readily revealed by the asymmetric contrast of their images in grazing-incidence x-ray topographs using pyramidal plane reflections. The circumferential and radial distributions of the sense of elementary threading screw dislocations have been studied and no clear trends are observed in either distribution.


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