Surface Structure of LiNi0.8Co0.2O2: a New Experimental Technique Using in Situ X-ray Diffraction and Two-Dimensional Epitaxial Film Electrodes

2009 ◽  
Vol 21 (13) ◽  
pp. 2632-2640 ◽  
Author(s):  
Kazuyuki Sakamoto ◽  
Masaaki Hirayama ◽  
Noriyuki Sonoyama ◽  
Daisuke Mori ◽  
Atsuo Yamada ◽  
...  
Keyword(s):  
Surface Structure ◽  
Experimental Technique ◽  
Epitaxial Film ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray

Evolution of implicate order from amorphous to polycrystalline Sn-doped In2O3 films determined by in situ two-dimensional X-ray diffraction measurements

2020 ◽  
Vol 13 (6) ◽  
pp. 065502
Author(s):  
Yutaka Furubayashi ◽  
Shintaro Kobayashi ◽  
Makoto Maehara ◽  
Kazuhiko Ishikawa ◽  
Katsuhiko Inaba ◽  
...  
Keyword(s):  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Implicate Order

A 1000°C furnace forin situX-ray diffraction

2001 ◽  
Vol 34 (5) ◽  
pp. 677-678 ◽  
Author(s):  
Anna Puig-Molina ◽  
Bernard Gorges ◽  
Heinz Graafsma
Keyword(s):  
Solid State ◽  
Detector System ◽  
Solid State Reactions ◽  
Controlled Atmosphere ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Geometry ◽  
Melting And Crystallization

A furnace covering the temperature range from 25 to 1000°C has been designed and constructed to studyin situsolid-state reactions and melting and crystallization processes, with X-ray diffraction in transmission geometry using a two-dimensional-detector system. The oven can work in low vacuum and under a controlled atmosphere.

The Kepler tiling as the oldest complex surface structure in history: X-ray structure analysis of a two-dimensional oxide quasicrystal approximant

2016 ◽  
Vol 231 (12) ◽  
Author(s):  
Sumalay Roy ◽  
Katayoon Mohseni ◽  
Stefan Förster ◽  
Martin Trautmann ◽  
Florian Schumann ◽  
...  
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
Complex Surface ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray

Abstract:We have carried out a surface X-ray diffraction (SXRD) analysis of the approximant structure related to the recently discovered two-dimensional dodecagonal oxidic quasicrystal. The structure is characterized by the 3

Aging-time-resolvedin situmicrostructural investigation of tin films electroplated on copper substrates, applying two-dimensional-detector X-ray diffraction

2013 ◽  
Vol 46 (6) ◽  
pp. 1645-1653 ◽  
Author(s):  
Jendrik Stein ◽  
Udo Welzel ◽  
Werner Huegel ◽  
Sabine Blatt ◽  
Eric Jan Mittemeijer
Keyword(s):  
Diffraction Method ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Sn Whisker ◽  
Grain Rotation ◽  
Tin Films ◽  
X Ray ◽  
Layer Deposition ◽  
Growth Phenomenon

Pure thin tin films, electroplated on copper substrates, were investigated byin situX-ray diffraction analysis during room-temperature aging, using a laboratory diffractometer equipped with a two-dimensional detector. Diffraction spots of single Sn grains in the Sn film could be observed and traced over time by using the diffraction method adopted. For the as-deposited specimens, striking changes of the Sn reflection spots, concerning their position and intensity, as well as sudden appearances and disappearances of additional diffraction spots, were observed. This could be ascribed to local microstructural changes in the films such as grain rotation, grain growth and grain dissolution. In contrast to the as-deposited specimens, so-called post-baked specimens (i.e.annealed at 423 K for 1 h after layer deposition) exhibited a stable microstructure. The results obtained are discussed with respect to their relevance for the Sn whisker-growth phenomenon.

In situ structural analysis of BPDA-PPD polyimide thin film using two-dimensional grazing incidence X-ray diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 109-112 ◽  
Author(s):  
J. Kikuma ◽  
T. Nayuki ◽  
T. Ishikawa ◽  
S. Matsuno ◽  
G. Asano
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Molecular Chain ◽  
Curing Temperature ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Cooling Process ◽  
X Ray ◽  
Plane Direction

Structural development of BPDA-PPD polyimide thin film has been investigated by in situ grazing incidence X-ray diffraction at the BL24XU beamline of the SPring-8. Optimizing the sample shape, two-dimensional images were measured successfully without sacrificing angle resolution. It has been clearly shown that the crystallization first begins in the in-plane direction, at the curing temperature of 180 °C, in which the periodic structure of the molecular chain axis (c axis) is developed. The crystallization in the surface normal (out-of-plane) direction is observed later, at the curing temperature above 300 °C. A slight increase of the d spacing of the c axis during heating process has been observed, suggesting the stretching of the contracted molecular chain in accordance with the curing process. In the cooling process, the decrease of the d spacings for a and b axes was considerable, which indicates thermal expansion of the crystals at high temperatures. The increases in the peak intensities during the cooling process have been observed, which indicate the d spacing of each axis becomes close to the equilibrium value to produce higher periodicity.

The structure-directing amine changes everything: structures and optical properties of two-dimensional thiostannates

2017 ◽  
Vol 73 (5) ◽  
pp. 931-940 ◽  
Author(s):  
Mette Ø. Filsø ◽  
Iman Chaaban ◽  
Amer Al Shehabi ◽  
Jørgen Skibsted ◽  
Nina Lock
Keyword(s):  
Optical Properties ◽  
Uv Light ◽  
Hexagonal Structure ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Orthorhombic Unit Cell ◽  
Structural Units ◽  
X Ray ◽  
Semiconducting Compounds

Two different two-dimensional thiostannates (SnS) were synthesized using tris(2-aminoethyl)amine (tren) or 1-(2-aminoethyl)piperidine (1AEP) as structure-directing agents. Both structures consist of negatively charged thiostannate layers with charge stabilizing cations sandwiched in-between. The fundamental building units are Sn3S4broken-cube clusters connected by double sulfur bridges to form polymeric (Sn3S72−)nhoneycomb hexagonal layers. The compounds are members of theR-SnS-1 family of structures, whereRindicates the type of cation. Despite consisting of identical structural units, the band gaps of the two semiconducting compounds were found to differ substantially at 2.96 eV (violet–blue light) and 3.21 eV (UV light) for tren–SnS-1 and 1AEP–SnS-1, respectively. Aiming to explain the observed differences in optical properties, the structures of the two thiostannates were investigated in detail based on combined X-ray diffraction, solid-state13C and119Sn MAS NMR spectroscopy and scanning electron microscopy studies. The compound tren–SnS-1 has a hexagonal structure consisting of planar SnS layers with regular hexagonal pores and disordered cations, whereas 1AEP–SnS-1 has an orthorhombic unit cell with ordered cations, distorted hexagonal pores and non-planar SnS layers. In the formation of 1AEP–SnS-1, an intramolecular reaction of the structure-directing piperidine takes place to form anN-heterobicyclic cation throughin situC—H activation. Hirshfeld surface analysis was used to investigate the interaction between the SnS layers and cations in 1AEP–SnS-1 and revealed that the most nucleophilic part of the SnS sheets is one of the two crystallographically distinct double sulfur bridges.

Sign in / Sign up

Export Citation Format

Share Document