In situ structural analysis of BPDA-PPD polyimide thin film using two-dimensional grazing incidence X-ray diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 109-112 ◽  
Author(s):  
J. Kikuma ◽  
T. Nayuki ◽  
T. Ishikawa ◽  
S. Matsuno ◽  
G. Asano
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Molecular Chain ◽  
Curing Temperature ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Cooling Process ◽  
X Ray ◽  
Plane Direction

Structural development of BPDA-PPD polyimide thin film has been investigated by in situ grazing incidence X-ray diffraction at the BL24XU beamline of the SPring-8. Optimizing the sample shape, two-dimensional images were measured successfully without sacrificing angle resolution. It has been clearly shown that the crystallization first begins in the in-plane direction, at the curing temperature of 180 °C, in which the periodic structure of the molecular chain axis (c axis) is developed. The crystallization in the surface normal (out-of-plane) direction is observed later, at the curing temperature above 300 °C. A slight increase of the d spacing of the c axis during heating process has been observed, suggesting the stretching of the contracted molecular chain in accordance with the curing process. In the cooling process, the decrease of the d spacings for a and b axes was considerable, which indicates thermal expansion of the crystals at high temperatures. The increases in the peak intensities during the cooling process have been observed, which indicate the d spacing of each axis becomes close to the equilibrium value to produce higher periodicity.

Analysis the Actual Nanostructure of α Phase Polyoctylfluorene Thin Film via Synchrotron Grazing-Incidence X-Ray Diffraction

2013 ◽  
Vol 333-335 ◽  
pp. 1832-1835
Author(s):  
Liu Ran Chen ◽  
Xi Chen ◽  
Ji Cai Liang ◽  
Ji Dong Zhang
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
One Dimensional ◽  
X Ray ◽  
Α Phase ◽  
Out Of Plane ◽  
Diffraction Signal

The nanostructure of α phase polyoctylfluorene thin film was characterized using normal X-ray diffraction, one-dimensional out-of-plane grazing incidence X-ray diffraction and two-dimensional grazing incidence X-ray diffraction with lab diffractometer and synchrotron diffractometer. The results show that using grazing incidence X-ray diffraction the weak diffraction signal of thin film can be observed after the elimination of background signals. Incorrect (h10) diffraction signals can be collected by lab diffractometer due to its low collimation and resolution, which can be overcome by using synchrotron diffractometer with high collimation and resolution that reveal the actual microstructure of polyoctylfluorene thin film.

Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior

2008 ◽  
Vol 41 (6) ◽  
pp. 1076-1088 ◽  
Author(s):  
Guillaume Geandier ◽  
Pierre-Olivier Renault ◽  
Simon Teat ◽  
Eric Le Bourhis ◽  
Bruno Lamongie ◽  
...  
Keyword(s):  
Thin Film ◽  
Tensile Testing ◽  
Gold Films ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Reflection And Transmission ◽  
Strain Measurements ◽  
X Ray ◽  
Polycrystalline Thin Films

Performing a completein situmechanical property analysis of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two-dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements duringin situtensile testing of gold films deposited on polyimide substrates. Advantages and drawbacks in the use of two-dimensional detectors for this type of analysis are discussed for two commonly used geometries: reflection and transmission.

Strain, Stress, and Magnetic Surfaceanisotropy of Epitaxial FE(110)/MO (110) Multilayers

1993 ◽  
Vol 317 ◽  
Author(s):  
R.M. Osgood ◽  
B.M. Clemens ◽  
R.L. White ◽  
S. Brennan
Keyword(s):  
Strain State ◽  
Single Layer ◽  
Grazing Incidence ◽  
Magnetic Surface ◽  
Stress And Strain ◽  
Surface Anisotropy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Plane Direction ◽  
Strain Stress

ABSTRACTGrazing incidence and asymmetric X-ray diffraction were used to measure the stress and strain state of Fe(110)/Mo(110) Multilayers. The highest stress in the Fe constituent of the multilayer was along the [110] in-plane direction and was due to interaction with the substrate. The Magnetic anisotropy of the Fe Multilayer constituent was measured and the magnetic surface anisotropy, which favored in-plane [001] magnetization, was deduced. In contrast, the magnetic surface anisotropy of a single layer of Fe on W preferred in-plane [110] magnetization, in agreement with the Néel Model.

Structure of in-situ grown GaAs(001) reconstructed surfaces by grazing incidence X-ray diffraction

1989 ◽  
Vol 211-212 ◽  
pp. 39-47 ◽  
Author(s):  
M. Sauvage-Simkin ◽  
R. Pinchaux ◽  
J. Massies ◽  
P. Claverie ◽  
J. Bonnet ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstructed Surfaces

Ultrahigh‐vacuum four‐circle diffractometer for grazing incidence x‐ray diffraction on in situ MBE grown III‐V semiconductor surfaces

1989 ◽  
Vol 60 (7) ◽  
pp. 2369-2372 ◽  
Author(s):  
P. Claverie ◽  
J. Massies ◽  
R. Pinchaux ◽  
M. Sauvage‐Simkin ◽  
J. Frouin ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
Semiconductor Surfaces ◽  
X Ray Diffraction ◽  
X Ray

Inorganic mixed phase templated by a fatty acid monolayer at the air–water interface: the Mn and Mg case

2018 ◽  
Vol 20 (9) ◽  
pp. 6629-6637 ◽  
Author(s):  
Alae El Haitami ◽  
Michel Goldmann ◽  
Philippe Fontaine ◽  
Marie-Claude Fauré ◽  
Sophie Cantin
Keyword(s):  
Grazing Incidence ◽  
Water Interface ◽  
X Ray Diffraction ◽  
Inorganic Layer ◽  
X Ray ◽  
First Order ◽  
First Order Phase Transition ◽  
Air Water Interface ◽  
First Order Phase

A first-order phase transition with a peculiar feature is evidenced by means of in situ grazing incidence X-ray diffraction in the 2D organic phase-mediated nucleation of an inorganic layer.

In situ grazing-incidence X-ray diffraction during electrodeposition of birnessite thin films: Identification of solid precursors

2011 ◽  
Vol 13 (5) ◽  
pp. 491-494 ◽  
Author(s):  
M. Ndjeri ◽  
S. Peulon ◽  
M.L. Schlegel ◽  
A. Chaussé
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray
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