Exploring the “Living” Growth of Block Copolymer Nanofibers from Surface-Confined Seeds by In Situ Solution-Phase Atomic Force Microscopy

2022 ◽  
Author(s):  
Robert L. Harniman ◽  
Samuel Pearce ◽  
Ian Manners
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Solution Phase ◽  
Force Microscopy ◽  
Atomic Force

Direct Imaging of Interfacial Fluctuations in Confined Block Copolymer with in Situ Slow-Scan-Disabled Atomic Force Microscopy

ACS Nano ◽  
2019 ◽  
Vol 13 (10) ◽  
pp. 11741-11752 ◽  
Author(s):  
Jonathan G. Raybin ◽  
Julia G. Murphy ◽  
Moshe Dolejsi ◽  
S. J. Sibener
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Direct Imaging ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Imaging of Block Copolymer Micelles Adsorbed on a Solid Substrate

Langmuir ◽  
2003 ◽  
Vol 19 (24) ◽  
pp. 10449-10453 ◽  
Author(s):  
Simon D. Connell ◽  
Stephen Collins ◽  
Johan Fundin ◽  
Zhuo Yang ◽  
Ian W. Hamley
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Solid Substrate ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Block Copolymer Micelles ◽  
Copolymer Micelles

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force
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