Dissolution Kinetics, Step and Surface Morphology of Magnesite (104) Surfaces in Acidic Aqueous Solution at 60 °C by Atomic Force Microscopy under Defined Hydrodynamic Conditions

2002 ◽  
Vol 106 (26) ◽  
pp. 6696-6705 ◽  
Author(s):  
Steven R. Higgins ◽  
Lawrence H. Boram ◽  
Carrick M. Eggleston ◽  
Barry A. Coles ◽  
Richard G. Compton ◽  
...  
Keyword(s):  
Aqueous Solution ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Dissolution Kinetics ◽  
Hydrodynamic Conditions ◽  
Acidic Aqueous Solution ◽  
Force Microscopy ◽  
Atomic Force

Dissolution kinetics of magnesite in acidic aqueous solution, a hydrothermal atomic force microscopy (HAFM) study: step orientation and kink dynamics

2001 ◽  
Vol 65 (23) ◽  
pp. 4257-4266 ◽  
Author(s):  
Guntram Jordan ◽  
Steven R Higgins ◽  
Carrick M Eggleston ◽  
Kevin G Knauss ◽  
Wolfgang W Schmahl
Keyword(s):  
Aqueous Solution ◽  
Atomic Force Microscopy ◽  
Dissolution Kinetics ◽  
Acidic Aqueous Solution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Kinetics Of

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

Surface morphology studies on sublimation grown GaN by atomic force microscopy

1999 ◽  
Vol 200 (3-4) ◽  
pp. 348-352 ◽  
Author(s):  
R.S Qhalid Fareed ◽  
S Tottori ◽  
K Nishino ◽  
S Sakai
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force

Development of a New Electrochemical Atomic Force Microscopy Tool for Obtaining Surface Morphology Through Electrochemical Reaction

2019 ◽  
Vol 19 (3) ◽  
pp. 1242-1247 ◽  
Author(s):  
Longshou Zheng ◽  
Ho Jae Shim ◽  
Yinhua Cui ◽  
Yuan Gao ◽  
Kang Won Lee ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Electrochemical Reaction ◽  
Force Microscopy ◽  
Atomic Force

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

MICROCRACKS IN ~ 100 MeV Si7+-ION-IRRADIATED p-SILICON SURFACES

2004 ◽  
Vol 11 (03) ◽  
pp. 265-269
Author(s):  
O. P. SINHA ◽  
P. C. SRIVASTAVA ◽  
V. GANESAN
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Target Surface ◽  
Silicon Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Induced Stress

The p-silicon surfaces have been irradiated with ~ 100 MeV Si 7+ions to a fluence of 2.2×1013 ions cm -2, and surface morphology has been studied with atomic force microscopy (AFM). Interesting features of cracks of ~ 47 nm in depth and ~ 103 nm in width on the irradiated surfaces have been observed. The observed features seemed to have been caused by the irradiation-induced stress in the irradiated regions of the target surface.

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