Combining Force−Distance Curves and Lateral Force Microscopy:  Quantitative Measurements of Atomic Scale Stick−Slip Responses and Frictional Properties

Langmuir ◽  
2003 ◽  
Vol 19 (6) ◽  
pp. 2528-2531 ◽  
Author(s):  
Gregory S. Watson ◽  
Bradley P. Dinte ◽  
Jolanta A. Blach ◽  
Sverre Myhra
Keyword(s):  
Lateral Force ◽  
Atomic Scale ◽  
Lateral Force Microscopy ◽  
Stick Slip ◽  
Force Microscopy ◽  
Frictional Properties ◽  
Quantitative Measurements

Effect of Phases on the Frictional Properties of Electroless Ni-B Nano-Composite Coating

2010 ◽  
Vol 66 ◽  
pp. 120-125 ◽  
Author(s):  
Soupitak Pal ◽  
Vikram Jayaram ◽  
Sanjay Kumar Biswas ◽  
Yancy Riddle
Keyword(s):  
Heat Treatment ◽  
Friction Coefficient ◽  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Nano Composite ◽  
Force Microscopy ◽  
Frictional Properties ◽  
Nano Composite Coating ◽  
Phase Mixture ◽  
Electroless Ni

As-deposited amorphous (determined through XRD) electroless Ni-B coating upon heat treatment transforms to crystalline phases, Ni3B, Ni2B and Ni whose volume fractions can vary widely. A micro and nano tribological study through ball-on-disk tribometer and lateral force microscopy has been performed to understand the effect of phase mixture (Ni3B +Ni2B) on the frictional properties of this coating. Though scaling of the contact area from micro to nano level strongly influences the friction coefficient, it has also been found that increase in the Ni2B:Ni3B ratio of the crystalline coating reduces the friction coefficient significantly.

scholarly journals Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime

2018 ◽  
Vol 89 (11) ◽  
pp. 113902 ◽  
Author(s):  
Mathias J. Boland ◽  
Jacob L. Hempel ◽  
Armin Ansary ◽  
Mohsen Nasseri ◽  
Douglas R. Strachan
Keyword(s):  
Lateral Force ◽  
Linear Regime ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Low Load ◽  
Non Linear ◽  
Calibration Material

Quantitative Lateral Force Microscopy

2009 ◽  
pp. 429-445
Author(s):  
Holger Schnherr ◽  
Ewa Tocha ◽  
Jing Song ◽  
G. Julius Vancso
Keyword(s):  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Force Microscopy
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