Enhancement of axial resolution in fluorescence microscopy by standing-wave excitation

Nature ◽  
1993 ◽  
Vol 366 (6450) ◽  
pp. 44-48 ◽  
Author(s):  
Brent Bailey ◽  
Daniel L. Farkas ◽  
D. Lansing Taylor ◽  
Frederick Lanni
Author(s):  
Frederick Lanni ◽  
Brent Bailey ◽  
Daniel L. Farkas ◽  
D. Lansing Taylor

When the depth-of-field of a microscope is less than the axial dimension of the specimen, 3d information can be derived from a set of images recorded as the specimen is stepped through the object focal plane of the microscope. This procedure, known as optical sectioning microscopy (OSM), is the same in direct imaging and confocal scanning. For both of these cases in fluorescence microscopy, axial (depth) resolution is more limited than transverse resolution, for fundamental reasons. Our research aim has been to enhance axial resolution in fluorescence OSM (FOSM) while retaining the high-speed information transfer characteristics of direct imaging that are necessary for 3d studies of living cells in culture.Standing-wave fluorescence microscopy (SWFM) is a direct imaging method in which the object is illuminated by a three-dimensional field of planar interference fringes (standing waves) oriented parallel to the focal plane of the microscope. This field is produced in the specimen by crossing two coherent, collimated, s-polarized beams of equal amplitude directed through the specimen at complementary angles (θ, π -θ) relative to the axis of the microscope.


1994 ◽  
Vol 4 (7) ◽  
pp. 262-265 ◽  
Author(s):  
Frederick Lanni ◽  
Brent Bailey

2007 ◽  
Vol 33 (5-6) ◽  
pp. 433-443 ◽  
Author(s):  
Sylvia Glaschick ◽  
Carlheinz Röcker ◽  
Karen Deuschle ◽  
Jörg Wiedenmann ◽  
Franz Oswald ◽  
...  

2013 ◽  
Vol 46 (37) ◽  
pp. 375001 ◽  
Author(s):  
S Döring ◽  
F Schönbohm ◽  
U Berges ◽  
D E Bürgler ◽  
C M Schneider ◽  
...  

2005 ◽  
Vol 246 (4-6) ◽  
pp. 313-321 ◽  
Author(s):  
M.T. Caballero ◽  
P. Andrés ◽  
A. Pons ◽  
J. Lancis ◽  
M. Martínez-Corral

2011 ◽  
Vol 83 (16) ◽  
Author(s):  
Sven Döring ◽  
Frank Schönbohm ◽  
Ulf Berges ◽  
Reinert Schreiber ◽  
Daniel E. Bürgler ◽  
...  
Keyword(s):  

2005 ◽  
Vol 12 (2) ◽  
pp. 113-123
Author(s):  
Charles H. Keith ◽  
Mark A. Farmer

Performing reflection-mode (backscatter-mode) confocal microscopy on cells growing on reflective substrates gives images that have improved contrast and are more easily interpreted than standard reflection-mode confocal micrographs (Keith et al., 1998). However, a number of factors degrade the quality of images taken with the highest-resolution microscope objectives in this technique. We here describe modifications to reflection-enhanced backscatter confocal microscopy that (partially) overcome these factors. With these modifications of the technique, it is possible to visualize structures the size—and refractility—of individual microtubules in intact cells. Additionally, we demonstrate that this technique, in common with fluorescence techniques such as standing wave widefield fluorescence microscopy and 4-Pi confocal microscopy, offers improved resolution in the Z-direction.


Sign in / Sign up

Export Citation Format

Share Document