Mapping the reactions of hexavalent chromium [Cr(vi)] in iron nanoparticles using spherical aberration corrected scanning transmission electron microscopy (Cs-STEM)

2014 ◽  
Vol 6 (10) ◽  
pp. 3211-3214 ◽  
Author(s):  
Lan Ling ◽  
Wei-xian Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Iron Nanoparticles ◽  
Spherical Aberration ◽  
Zero Valent Iron ◽  
Transmission Electron ◽  
Nanoscale Zero Valent Iron ◽  
Scanning Transmission ◽  
Aberration Corrected

Mapping Cr(VI) reactions within nanoscale zero-valent iron.

Fine structural features of nanoscale zero-valent iron characterized by spherical aberration corrected scanning transmission electron microscopy (Cs-STEM)

The Analyst ◽  
2014 ◽  
Vol 139 (18) ◽  
pp. 4512-4518 ◽  
Author(s):  
Airong Liu ◽  
Wei-xian Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Zero Valent Iron ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Nanoscale Zero Valent Iron ◽  
Scanning Transmission ◽  
Aberration Corrected

An angstrom-resolution physical model of nanoscale zero- valent iron (nZVI) is generated with a combination of spherical aberration corrected scanning transmission electron microscopy (Cs-STEM) and energy-dispersive X-ray spectroscopy (EDS).

scholarly journals Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1344-1345
Author(s):  
D Williams ◽  
M Watanabe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

scholarly journals Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1238-1239
Author(s):  
G. Nicotra ◽  
Q.M. Ramasse ◽  
I. Deretzis ◽  
C. Bongiorno ◽  
C. Spinella ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Bonding ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Scale ◽  
Scale Analysis ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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