Ultra-small rhenium clusters supported on graphene

Physical Chemistry Chemical Physics ◽

10.1039/c4cp05660d ◽

2015 ◽

Vol 17 (12) ◽

pp. 7898-7906 ◽

Author(s):

Orlando Miramontes ◽

Franco Bonafé ◽

Ulises Santiago ◽

Eduardo Larios-Rodriguez ◽

Jesús J. Velázquez-Salazar ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Density Functional ◽

Density Functional Theory Calculations ◽

Functional Theory ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

In this work, the adsorption of very small rhenium clusters (2–13 atoms) supported on graphene was studied by high-angle annular dark field-scanning transmission electron microscopy (HAADF-STEM) in combination with density functional theory calculations.

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Quantitative Two-Dimensional (2D) Morphology–Selectivity Relationship of CoMoS Nanolayers: A Combined High-Resolution High-Angle Annular Dark Field Scanning Transmission Electron Microscopy (HR HAADF-STEM) and Density Functional Theory (DFT) Study

ACS Catalysis ◽

10.1021/acscatal.5b02628 ◽

2016 ◽

Vol 6 (2) ◽

pp. 1081-1092 ◽

Author(s):

Bertrand Baubet ◽

Maria Girleanu ◽

Anne-Sophie Gay ◽

Anne-Lise Taleb ◽

Maxime Moreaud ◽

...

Keyword(s):

Scanning Transmission Electron Microscopy ◽

Density Functional ◽

Two Dimensional ◽

Functional Theory ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Relationship Of

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The effect of cation ordering and domain boundaries on low loss Ba(BI1/3BII2/3)O3 perovskite dielectrics revealed by high-angle annular dark-field scanning transmission electron microscopy (HAADF STEM)

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2014.03.007 ◽

2014 ◽

Vol 34 (10) ◽

pp. 2285-2297 ◽

Author(s):

Feridoon Azough ◽

Robert Freer ◽

David Iddles ◽

Takeshi Shimada ◽

Bernhard Schaffer

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Cation Ordering ◽

Low Loss ◽

Transmission Electron ◽

Domain Boundaries ◽

Scanning Transmission ◽

Annular Dark Field

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Structural study of an Al73Ni22Fe5 decagonal quasicrystal by high-angle annular dark-field scanning transmission electron microscopy

10.1093/jmicro/50.3.197 ◽

2001 ◽

Vol 50 (3) ◽

pp. 197-203 ◽

Author(s):

K. Saitoh ◽

M. Tanaka ◽

P. Tsai

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Structural Study ◽

Scanning Transmission Electron Microscopy ◽

Decagonal Quasicrystal ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)

2012 IEEE Statistical Signal Processing Workshop (SSP) ◽

10.1109/ssp.2012.6319793 ◽

2012 ◽

Author(s):

Singanallur Venkatakrishnan ◽

Lawrence Drummy ◽

Michael Jackson ◽

Marc De Graef ◽

Jeff Simmons ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Tomographic Reconstruction ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Direct Observation of Atomic Ordering and Interface Structure in Co2MnSi/MgO/Co2MnSi Magnetic Tunnel Junctions by High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy

Applied Physics Express ◽

10.1143/apex.2.093001 ◽

2009 ◽

Vol 2 (9) ◽

pp. 093001 ◽

Author(s):

Toyoo Miyajima ◽

Mikihiko Oogane ◽

Yasutoshi Kotaka ◽

Takashi Yamazaki ◽

Mineharu Tsukada ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Tunnel Junctions ◽

Interface Structure ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01613.x ◽

2006 ◽

Vol 223 (3) ◽

pp. 172-178 ◽

Author(s):

M. SHIOJIRI ◽

H. SAIJO

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Laser Diodes ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images

Ultramicroscopy ◽

10.1016/j.ultramic.2013.03.018 ◽

2013 ◽

Vol 131 ◽

pp. 1-9 ◽

Author(s):

Thorsten Mehrtens ◽

Knut Müller ◽

Marco Schowalter ◽

Dongzhi Hu ◽

Daniel M. Schaadt ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Concentration Profiles ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

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Comparison of Interface Characterization between Ag(In,Ga)Se$_{2}$ and Cu(In,Ga)Se$_{2}$ Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.126603 ◽

2011 ◽

Vol 50 ◽

pp. 126603 ◽

Author(s):

Zhang Xianfeng ◽

Tsuyoshi Kobayashi ◽

Yasuyoshi Kurokawa ◽

Yoshiyuki Tashiro ◽

Masahiro Ohtsuka ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Solar Cells ◽

Scanning Transmission Electron Microscopy ◽

Interface Characterization ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures

Applied Physics Letters ◽

10.1063/1.2998656 ◽

2008 ◽

Vol 93 (15) ◽

pp. 153107 ◽

Author(s):

J. Pizarro ◽

P. L. Galindo ◽

E. Guerrero ◽

A. Yáñez ◽

M. P. Guerrero ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

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High-angle annular dark-field scanning transmission electron microscopy and electron energy-loss spectroscopy of nano-granular Co–Al–O alloys

Scripta Materialia ◽

10.1016/s1359-6462(02)00626-7 ◽

2003 ◽

Vol 48 (7) ◽

pp. 909-914 ◽

Author(s):

N. Tanaka ◽

J. Yamasaki ◽

S. Mitani ◽

K. Takanashi

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Energy Loss ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Electron Energy Loss

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