An in situ spectroscopic study of the local structure of oxyfluoride melts: NMR insights into the speciation in molten LiF–LaF3–Li2O systems

2015 ◽  
Vol 44 (2) ◽  
pp. 522-529 ◽  
Author(s):  
Anne-Laure Rollet ◽  
Haruaki Matsuura ◽  
Catherine Bessada

An in situ high temperature NMR technique evidences the local structure of lithium lanthanum oxyfluoride melts.

2019 ◽  
Vol 57 (6) ◽  
pp. 843-851
Author(s):  
Alan J. Anderson ◽  
Robert A. Mayanovic ◽  
Thomas Lee

Abstract The local structure of Ta(V) in high-temperature fluoride- and chloride-bearing acidic solutions was investigated using in situ X-ray absorption spectroscopy (XAS). All XAS spectra were collected from two solutions, designated A and B, at beamline ID-20-C at the Advanced Photon Source, Argonne National Laboratory. Spectra were collected from solution A at 350 and 400 °C and from solution B at 25, 360, and 400 °C after the solutions were sealed in a hydrothermal diamond anvil cell. Solution A was prepared by dissolving Ta2O5 powder in 5% HF solution; solution B consisted of TaCl5 dissolved in 2% HF. The dominant tantalum species in solution A at elevated temperatures was TaF83–. In contrast, TaCl6–, which was the dominant complex in solution B at room temperature, disappeared as hydroxide complexes with an average ligand number between 5 and 7 became the dominant species at 350 and 400 °C. The XAS results confirm the previously recognized effect of fluoride activity on Ta speciation in hydrothermal fluids and suggest that both fluoride and hydroxide complexes play an important role in the transport of Ta in acidic fluoride-bearing solutions involved in the formation of mineralized mica-rich replacement units in granitic pegmatites.


2016 ◽  
Vol 43 (8) ◽  
pp. 587-595 ◽  
Author(s):  
Gennaro Ventruti ◽  
Giancarlo Della Ventura ◽  
Nicola Corriero ◽  
Daniele Malferrari ◽  
Alessandro F. Gualtieri ◽  
...  

2006 ◽  
Vol 9 (3-4) ◽  
pp. 374-380 ◽  
Author(s):  
Catherine Bessada ◽  
Anne-Laure Rollet ◽  
Aydar Rakhmatullin ◽  
Ioana Nuta ◽  
Pierre Florian ◽  
...  

2021 ◽  
Vol 174 ◽  
pp. 107238
Author(s):  
Bartłomiej A. Gaweł ◽  
Anna Ulvensøen ◽  
Katarzyna Łukaszuk ◽  
Astrid Marie F. Muggerud ◽  
Andreas Erbe

2019 ◽  
Vol 26 (5) ◽  
pp. 1733-1741 ◽  
Author(s):  
Jian Sun ◽  
Xiaojing Guo ◽  
Jing Zhou ◽  
Jianxing Dai ◽  
Sanzhao Song ◽  
...  

The microscopic structures of ThF4–LiF and ThF4–LiF–BeF2 molten salts have been systematically investigated by in situ high-temperature X-ray absorption fine-structure (XAFS) spectroscopy combined with molecular-dynamics (MD) simulations. The results reveal that the local structure of thorium ions was much more disordered in the molten state of the ThF4–LiF–BeF2 salt than that in ThF4–LiF, implying that the Th and F ions were exchanged more frequently in the presence of Be ions. The structures of medium-range-ordered coordination shells (such as Th–F2nd and Th–Th) have been emphasized by experimental and theoretical XAFS analysis, and they play a significant role in transport properties. Using MD simulations, the bonding properties in the molten ThF4–LiF and ThF4–LiF–BeF2 mixtures were evaluated, confirming the above conclusion. This research is, to the best of our knowledge, the first systematic study on the ThF4–LiF–BeF2 molten salt via quantitative in situ XAFS analysis and MD simulations.


2009 ◽  
Vol 494 (1-2) ◽  
pp. 86-93 ◽  
Author(s):  
Valdirene G. de Resende ◽  
Alain Peigney ◽  
Eddy De Grave ◽  
Christophe Laurent

Author(s):  
N. Rozhanski ◽  
A. Barg

Amorphous Ni-Nb alloys are of potential interest as diffusion barriers for high temperature metallization for VLSI. In the present work amorphous Ni-Nb films were sputter deposited on Si(100) and their interaction with a substrate was studied in the temperature range (200-700)°C. The crystallization of films was observed on the plan-view specimens heated in-situ in Philips-400ST microscope. Cross-sectional objects were prepared to study the structure of interfaces.The crystallization temperature of Ni5 0 Ni5 0 and Ni8 0 Nb2 0 films was found to be equal to 675°C and 525°C correspondingly. The crystallization of Ni5 0 Ni5 0 films is followed by the formation of Ni6Nb7 and Ni3Nb nucleus. Ni8 0Nb2 0 films crystallise with the formation of Ni and Ni3Nb crystals. No interaction of both films with Si substrate was observed on plan-view specimens up to 700°C, that is due to the barrier action of the native SiO2 layer.


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